Some key issues pertaining to analysis of small-angle scattering data affected by multiple scattering

Journal of Applied Crystallography

Volumn 36, Issue 3 I, 2003, Pages 840-844

  Mazumder, S ^a   Sen, D ^a   Patra, A K ^a  

^a BHABHA ATOMIC RESEARCH CENTRE   (India)

Author keywords

Alumina; Effective medium approximation; Multiple scattering

Indexed keywords

CONFERENCE PAPER; DATA ANALYSIS; LINEAR SYSTEM; MATHEMATICAL ANALYSIS; MULTIPLE SCATTERING; NEUTRON SCATTERING; OPTICAL RESOLUTION; STATISTICAL ANALYSIS; THICKNESS;

EID: 0038377502     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S002188980300027X     Document Type: Conference Paper

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