Assessment of detector calibration materials for SANS experiments

Journal of Applied Crystallography

Volumn 32, Issue 6, 1999, Pages 1157-1163

  Ghosh, R E ^a   Rennie, Adrian R ^a,b  

^a INSTITUT LAUE LANGEVIN   (France)

^b KING'S COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0010306633     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889899009991     Document Type: Article

References (17)

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