Measuring the linearity of X-ray detectors: Consequences for absolute attenuation, scattering and absolute Bragg intensities

Journal of Applied Crystallography

Volumn 44, Issue 2, 2011, Pages 281-286

  Barnea, Zwi ^a   Chantler, Christopher T ^a   Glover, Jack L ^a,b   Grigg, Mark W ^d   Islam, M Tauhidul ^a   De Jonge, Martin D ^c   Rae, Nicholas A ^a   Tran, Chanh Q ^e  

^a UNIVERSITY OF MELBOURNE   (Australia)

^b NATIONAL INSTITUTE OF STANDARDS   (United States)

^c AUSTRALIAN SYNCHROTRON   (Australia)

^d DEFENCE SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

^e LA TROBE UNIVERSITY   (Australia)

Author keywords

absolute measurements; linearity; X ray detectors

Indexed keywords

ABSOLUTE INTENSITY; ABSOLUTE MEASUREMENTS; ACCURATE MEASUREMENT; BRAGG INTENSITY; BRAGG REFLECTION; HIGHER ORDER; HIGHLY SENSITIVE; ION CHAMBER; LINEAR RESPONSE; LINEARITY; LINEARITY TEST; X RAY BEAM; X-RAY ATTENUATION; X-RAY DETECTOR; X-RAY DETECTORS;

DETECTORS; IONIZATION CHAMBERS; SINGLE CRYSTALS; X RAY APPARATUS;

X RAYS;

EID: 79953061451     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889811004493     Document Type: Article

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