Reduction of two-dimensional small- and wide-angle X-ray scattering data

Journal of Applied Crystallography

Volumn 40, Issue SUPPL. 1, 2007, Pages

  Boesecke, Peter ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Absolute intensity normalization; Data format; Image transformations; Metadata; Pinhole camera; SAXS; Statistical error propagation; Synchrotron X rays; Time resolved experiments; Two dimensional data processing; WAXS

Indexed keywords

EID: 34248372968     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889807001100     Document Type: Conference Paper

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