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Volumn , Issue , 2008, Pages 55-91

Electrical characterization of nanostructures

Author keywords

deep levels transient spectroscopy; electrical characterization; GaN nanowires; spectral photocurrent; surface photovoltage

Indexed keywords


EID: 84882834411     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1016/B978-0-444-53099-8.00003-8     Document Type: Chapter
Times cited : (4)

References (74)
  • 8
    • 84882838398 scopus 로고
    • Growth and Characterization of Semiconductors, edited by
    • R.A. Stradling, P.C. Klipstein (Eds), Bristol, UK: IOP Publishing
    • D.W. Palmer (1990) Growth and Characterization of Semiconductors, edited by. R.A. Stradling, P.C. Klipstein (Eds) Adam Hilger Bristol, UK: IOP Publishing
    • (1990) Adam Hilger
    • Palmer, D.W.1
  • 12
    • 85148391585 scopus 로고    scopus 로고
    • University of Bologna
    • L. Polenta, PhD Thesis, University of Bologna, 1998.
    • (1998) PhD Thesis,
    • Polenta, L.1
  • 41
    • 0004278609 scopus 로고
    • 2nd ed., London: Cambridge University Press
    • R.A. Smith (1978) Semiconductors. 2nd ed. London: Cambridge University Press
    • (1978) Semiconductors
    • Smith, R.A.1
  • 42
    • 85046383515 scopus 로고
    • W. Smith (1873) Nature 7 303.
    • (1873) Nature , vol.7 , pp. 303
    • Smith, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.