Micro-and nano-structures in silicon studied by DLTS and scanning probe methods

Semiconductors

Volumn 41, Issue 4, 2007, Pages 421-426

  Cavalcoli, D ^a   Cavallini, A ^a   Rossi, M ^a   Pizzini, S ^b  

^a UNIVERSITY OF BOLOGNA   (Italy)

^b UNIVERSITY OF MILANO BICOCCA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34247648080     PISSN: 10637826     EISSN: None     Source Type: Journal    
DOI: 10.1134/S1063782607040112     Document Type: Article

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