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Volumn 31, Issue 10, 2001, Pages 954-965

Surface photovoltage spectroscopy of semiconductor structures: At the crossroads of physics, chemistry and electrical engineering

(2) Kronik, Leeor a,b Shapira, Yoram a

a TEL AVIV UNIVERSITY (Israel)

b University of Minnesota (United States)

Author keywords

Semiconductor structures; Surface photovoltage spectroscopy

Indexed keywords

ELECTRON ENERGY LEVELS; ELECTRONIC STRUCTURE; INTERFACES (MATERIALS); SPECTROSCOPIC ANALYSIS;

SURFACE PHOTOVOLTAGE SPECTROSCOPY (SPS);

SEMICONDUCTOR DEVICE STRUCTURES;

EID: 0035475857 PISSN: 01422421 EISSN: None Source Type: Journal
DOI: 10.1002/sia.1132 Document Type: Article

Times cited : (300)

References (78)

1
- 84944157894
- (1953) Bell System Tech. J. , vol.32 , pp. 1
- Brattain, W.H.¹ Bardeen, J.²

2
- 0033355063
- (1999) Surf. Sci. Rep. , vol.37 , pp. 1
- Kronik, L.¹ Shapira, Y.²

3
- 0000302721
- and references therein
- (1973) J. Vac. Sci. Technol. , vol.10 , pp. 130
- Gatos, H.C.¹ Lagowski, J.²

4
- 0003005829
- (1975) Surf. Sci. , vol.51 , pp. 45
- Brillson, L.J.¹

5
- 0002916239
- (1984) Phys. Rev. , vol.29 , pp. 6824
- Shapira, Y.¹ Brillson, L.J.² Heller, A.³

6
- 0002700568
- (1973) Surf. Sci. , vol.37 , pp. 30
- Heiland, G.¹ Mönch, W.²

7
- 85025794946
- (1980) Surf. Sci. , vol.99 , pp. 34
- Assmann, J.¹ Mönch, W.²

8
- 4243458616
- (1975) Surf. Sci. , vol.50 , pp. 451
- Büchel, M.¹ Lüth, H.²

9
- 4244088597
- (1977) Phys. Rev. , vol.B15 , pp. 865
- Lüth, H.¹ Büchel, M.² Dorn, R.³ Liehr, M.⁴ Matz, R.⁵

10
- 0001072521
- (1996) J. Appl. Phys. , vol.79 , pp. 8549
- Leibovitch, M.¹ Kronik, L.² Fefer, E.³ Burstein, L.⁴ Korobov, V.⁵ Shapira, Y.⁶

11
- 0002930547
- (1996) Appl. Phys. Lett. , vol.69 , pp. 2587
- Leibovitch, M.¹ Kronik, L.² Mishori, B.³ Shapira, Y.⁴ Hanson, C.M.⁵ Clawson, A.R.⁶

12
- 0030082295
- (1996) Appl. Phys. Lett. , vol.68 , pp. 879
- Bachrach-Ashkenasy, N.¹ Kronik, L.² Shapira, Y.³ Rosenwaks, Y.⁴ Hanna, M.C.⁵ Lei-bovitch, M.⁶ Ram, P.⁷

13
- 0031167257
- (1997) Solid State Commun. , vol.102 , pp. 877
- Aigoui, L.¹ Pollak, F.H.² Petruzello, T.J.³ Shahzad, K.⁴

14
- 0032000110
- (1998) Sol. Energy Mater. Sol. Cells , vol.51 , pp. 21
- Kronik, L.¹ Mishori, B.² Fefer, E.³ Shapira, Y.⁴ Riedl, W.⁵

15
- 0001754378
- (1998) Appl. Phys. Lett. , vol.73 , pp. 650
- Mishori, B.¹ Leibovitch, M.² Shapira, Y.³ Pollak, F.H.⁴ Streit, D.C.⁵ Wojtowicz, M.⁶

16
- 0002514299
- (2000) Appl. Phys. Lett. , vol.77 , pp. 37
- Huang, Y.S.¹ Malikova, L.² Pollak, F.H.³ Shen, H.⁴ Pamulapati, J.⁵ Newman, P.⁶

17
- 0003839459
- North-Holland: Amsterdam
- (1971) Semiconductor Surfaces (2nd edn)
- Many, A.¹ Goldstein, Y.² Grover, N.B.³

18
- 0003425106
- Springer-Verlag: Berlin
- (1993) Semiconductor Surfaces and Interfaces
- Mönch, W.¹

19
- 0003557797
- Springer-Verlag: Berlin
- (1993) Surfaces and Interfaces of Solids (2nd edn)
- Lüth, H.¹

20
- 0004005306
- John Wiley: New York
- (1981) Physics of Semiconductor Devices (2nd edn)
- Sze, S.M.¹

21
- 0024738576
- (1989) IEEE Trans. Electron. Dev. , vol.36 , pp. 1764
- Marshak, A.H.¹

22
- 4243049931
- (1996) Appl. Surf. Sci. , vol.104-105 , pp. 61
- Fefer, E.¹ Kronik, L.² Leibovitch, M.³ Shapira, Y.⁴ Riedl, W.⁵

23
- 0001506542
- (1999) J. Appl. Phys. , vol.86 , pp. 5573
- Gal, D.¹ Mastai, Y.² Hodes, G.³ Kronik, L.⁴

24
- 0004062702
- Prentice Hall: New Jersey
- (1989) Physical Properties of Semiconductors
- Wolfe, C.M.¹ Holonyak, N.² Stillman, G.E.³

25
- 0016980534
- (1976) Rev. Sci. Instrum. , vol.47 , pp. 840
- Besocke, K.¹ Berger, S.²

26
- 0344117198
- (1991) Rev. Sci. Instrum. , vol.62 , pp. 725
- Baikie, I.¹ Venderbosch, E.² Meyer, J.A.³ Estrup, P.J.Z.⁴

27
- 0020114984
- (1982) Jpn. J. Appl. Phys. , vol.21 , pp. 624
- Munakata, C.¹ Yagi, K.² Warabisako, T.³ Nanba, M.⁴ Matsubara, S.⁵

28
- 0020765847
- (1983) J. Phys. D: Appl. Phys. , vol.16 , pp. 1093
- Munakata, C.¹ Matsubara, S.²

29
- 0001120632
- (1997) Rev. Sci. Instrum. , vol.68 , pp. 3108
- Nabhan, W.¹ Equer, B.² Broniatowski, A.³ De Rosny, G.⁴

30
- 0003832847
- VCH Publishers: New York
- (1993) Scanning Tunneling Microscopy and Spectroscopy
- Bonnell, D.A.¹

31
- 0001122679
- (1990) Phys. Rev. Lett. , vol.64 , pp. 1051
- Hamers, R.J.¹ Markert, K.²

32
- 0001255560
- (1990) Phys. Rev. Lett. , vol.65 , pp. 456
- Kuk, Y.¹ Becker, R.S.² Silverman, P.J.³ Kochanski, G.P.⁴

33
- 0003065153
- (1991) J. Vac. Sci. Technol. , vol.B9 , pp. 1562
- Weaver, J.M.R.¹ Wickramasinghe, H.K.²

34
- 0033660167
- and references therein
- (2000) Int. Rev. Phys. Chem. , vol.19 , pp. 247
- Haase, G.¹

35
- 0001180712
- (2000) Phys. Rev. , vol.61 , pp. 11041
- Shikler, R.¹ Fried, N.² Meoded, T.³ Rosenwaks, Y.⁴

36
- 0000027781
- (1999) Appl. Phys. Lett. , vol.75 , pp. 2435
- Meoded, T.¹ Shikler, R.² Fried, N.³ Rosenwaks, Y.⁴

37
- 0002998546
- (1991) J. Appl. Phys. , vol.69 , pp. 15
- Burstein, L.¹ Bregman, J.² Shapira, Y.³

38
- 0019684353
- (1981) J. Electrochem. Soc. , vol.128 , pp. 2665
- Lagowski, J.¹ Jastrzebski, L.² Cullen, G.W.³

39
- 0000334342
- (1997) Appl. Phys. Lett. , vol.71 , pp. 3305
- Moons, E.¹ Eschle, M.² Grätzel, M.³

40
- 0032646686
- (1999) Langmuir , vol.15 , pp. 6969
- Jin, J.¹ Li, L.S.² Wang, X.³ Li, Y.⁴ Zhang, Y.J.⁵ Chen, X.⁶ Li, Y.-Z.⁷ Li, T.J.⁸

41
- 0026413327
- (1991) Surf. Sci. , vol.247 , pp. 94
- Adamowicz, B.¹ Szuber, J.²

42
- 0015679736
- (1973) Phys. Status Solidi. A , vol.20 , pp. 53
- Dmitruk, N.L.¹ Lyashenko, V.I.² Tereshenko, A.K.³ Spektor, S.A.⁴

43
- 0000789036
- (1997) Phys. Rev. , vol.B55 , pp. R1930
- Burstein, L.¹ Shapira, Y.² Partee, J.³ Shinar, J.⁴ Lubianiker, Y.⁵ Balberg, I.⁶

44
- 0002995757
- (1998) Proc. MRS Symp. , vol.482 , pp. 573
- Krystek, W.¹ Pollak, F.H.² Feng, Z.C.³ Schurman, M.⁴ Stall, R.A.⁵

45
- 0032070752
- (1998) J. Electrochem. Soc. , vol.145 , pp. 1748
- Kronik, L.¹ Ashkenasy, N.² Leibovitch, M.³ Fefer, E.⁴ Shapira, Y.⁵ Gorer, S.⁶ Hodes, G.⁷

46
- 0003070496
- (1975) CRC Crit. Rev. Solid State Sci. , vol.5 , pp. 273
- Clemens, H.¹ Mönch, W.²

47
- 0002998113
- (1978) Phys. Rev. , vol.18 , pp. 2431
- Brillson, L.J.¹

48
- 0003065155
- (1989) Sov. Phys. Semicond. , vol.23 , pp. 1271
- Musatov, A.L.¹ Geizer, S.V.² Korinfskii, A.D.³

49
- 0002929620
- (1992) Sov. Phys. Semicond. , vol.26 , pp. 1115
- Bednyi, B.I.¹ Suslov, L.A.² Baidus, N.V.³ Karpovich, I.A.⁴

50
- 0000977639
- (1997) Appl. Phys. Lett. , vol.70 , pp. 3011
- Kinrot, N.¹ Shapira, Y.² Bica de Moraes, M.A.³

51
- 0033579113
- (1999) J. Am. Chem. Soc. , vol.121 , pp. 10545
- Cohen, R.¹ Kronik, L.² Shanzer, A.³ Cahen, D.⁴ Liu, A.⁵ Rosenwaks, Y.⁶ Lorenz, J.⁷ Ellis, A.B.⁸

52
- 0000266935
- (1999) Rev. Sci. Instrum. , vol.70 , pp. 4032
- Bastide, S.¹ Cahen, D.² Gal, D.³ Kronik, L.⁴

53
- 0019608575
- (1981) J. Vac. Sci. Technol. , vol.19 , pp. 313
- Mönch, W.¹ Koke, P.² Krueger, S.³

54
- 0003067632
- (1980) Surf. Sci. , vol.99 , pp. 235
- Goldstein, B.¹ Szostak, D.J.²

55
- 0002921183
- (1990) J. Electron Spectrosc. Relat. Phenom. , vol.53 , pp. 19
- Szuber, J.¹

56
- 0002998115
- (1989) Surf. Sci. , vol.219 , pp. 420
- Thurgate, S.M.¹ Lacuesta, T.D.² Huck, N.R.³

57
- 0000238845
- (1980) Phys. Rev. , vol.B21 , pp. 625
- Clabes, J.¹ Henzler, M.²

58
- 0032654808
- (1999) Langmuir , vol.15 , pp. 4565
- Jin, J.¹ Li, L.S.² Li, Y.³ Zhang, Y.J.⁴ Chen, X.⁵ Wang, D.⁶ Jiang, S.⁷ Li, T.J.⁸ Gan, L.B.⁹ Huang, C.H.¹⁰

59
- 0023364827
- (1987) Appl. Phys. , vol.A43 , pp. 117
- Germanova, K.¹ Hardalov, C.²

60
- 0027667945
- (1993) Semicond. Sci. Technol. , vol.8 , pp. 1724
- Burstein, L.¹ Shapira, Y.²

61
- 0029309163
- (1995) Vacuum , vol.46 , pp. 501
- Kuzminski, S.¹ Pater, K.² Szaynok, A.T.³

62
- 0002975439
- (1995) Proc. AIP , vol.353 , pp. 453
- Gal, D.¹ Beier, J.² Moons, E.³ Hodes, G.⁴ Cahen, D.⁵ Kronik, L.⁶ Burstein, L.⁷ Mishori, B.⁸ Leibovitch, M.⁹ Shapira, Y.¹⁰ Hariskos, D.¹¹ Klenk, R.¹² Schock, H.-W.¹³

63
- 0029221966
- (1995) Thin Solid Films , vol.255 , pp. 74
- Dittrich, T.¹ Kashkarov, P.K.² Konstantinova, E.A.³ Timoshenko, V.Y.⁴

64
- 0029543124
- (1995) J. Appl. Phys. , vol.78 , pp. 7163
- Burstein, L.¹ Shapira, Y.² Bennet, B.R.³ Del Alamo, J.A.⁴

65
- 0001341572
- (1998) Appl. Phys. Lett. , vol.72 , pp. 3020
- Kumar, S.¹ Ganguli, T.² Bhattacharya, P.³ Roy, U.N.⁴ Chandvankar, S.S.⁵ Arora, B.M.⁶

66
- 0033350450
- (1999) Physica , vol.273-274 , pp. 689
- Olafsson, H.Ö.¹ Gudmundsson, J.T.² Svavarsson, H.G.³ Gislason, H.P.⁴

67
- 0002928283
- (1991) Sov. Phys. Semicond. , vol.25 , pp. 874
- Bednyi, B.I.¹ Karpovich, I.A.² Baidus, N.V.³ Boldyrevskii, P.V.⁴ Stepanov, A.S.⁵ Fedoseeva, N.V.⁶

68
- 0001384702
- (1999) J. Appl. Phys. , vol.85 , pp. 6690
- Lubomirsky, I.¹ Chang, D.T.² Stafsudd, O.M.³

69
- 0001173722
- (1990) Sov. Phys. Semicond. , vol.24 , pp. 1346
- Karpovich, I.A.¹ Aleshkin, V.Y.² Anshon, A.V.³ Babushkina, T.S.⁴ Zvonkov, B.N.⁵ Malkina, I.G.⁶

70
- 0026884784
- (1992) J. Vac. Sci. Technol. , vol.B10 , pp. 1803
- Wessles, B.W.¹ Qian, L.Q.²

71
- 0031701823
- (1999) J. Appl. Phys. , vol.83 , pp. 1146
- Ashkenasy, N.¹ Leibovitch, M.² Shapira, Y.³ Pollak, F.H.⁴ Burnham, G.T.⁵ Wang, X.⁶

72
- 0035932282
- (2001) Mater. Sci. Eng. B , vol.80 , pp. 178
- Pollak, F.H.¹

73
- 0001257733
- (1999) Phys. Rev. , vol.B59 , pp. 9748
- Shalish, I.¹ Kronik, L.² Segal, G.³ Shapira, Y.⁴ Rosenwaks, Y.⁵ Tisch, U.⁶ Salzman, J.⁷

74
- 0000853643
- (2000) Phys. Rev. , vol.B61 , pp. 15573
- Shalish, I.¹ Kronik, L.² Segal, G.³ Shapira, Y.⁴ Zamir, S.⁵ Meyler, B.⁶ Salzman, J.⁷

75
- 0001590395
- (2000) Appl. Phys. Lett. , vol.77 , pp. 987
- Shalish, I.¹ Kronik, L.² Segal, G.³ Shapira, Y.⁴ Eizenberg, M.⁵ Salzman, J.⁶

76
- 0000740718
- (1990) Appl. Phys. Lett. , vol.57 , pp. 458
- Rosenwaks, Y.¹ Burstein, L.² Shapira, Y.³ Huppert, D.⁴

77
- 0029308714
- (1995) Vacuum , vol.46 , pp. 489
- Czekala-Mukalled, Z.¹ Kuzminski, S.² Tlaczala, M.³

78
- 0000630729
- (2001) J. Appl. Phys. , vol.89 , pp. 390
- Shalish, I.¹ Burstein, L.² Shapira, Y.³ Salzman, J.⁴

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