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Volumn 6, Issue 7, 2006, Pages 1548-1551

Defect distribution along single GaN nanowhiskers

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; ELECTRON TRANSITIONS; GALLIUM NITRIDE; GROWTH (MATERIALS); MOLECULAR BEAM EPITAXY; PHOTOCONDUCTIVITY; PHOTOCURRENTS;

EID: 33746930224     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl060332n     Document Type: Article
Times cited : (40)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.