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Volumn 13, Issue 8, 2013, Pages 3671-3677

Dynamic evolution of conducting nanofilament in resistive switching memories

Author keywords

In situ TEM; nanofilament; redox; resistive switching; RRAM; unipolar

Indexed keywords

IN-SITU TEM; NANOFILAMENT; REDOX; RESISTIVE SWITCHING; RRAM; UNIPOLAR;

EID: 84881584143     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl4015638     Document Type: Article
Times cited : (340)

References (33)
  • 8
    • 84881581064 scopus 로고    scopus 로고
    • International Technology Roadmap for Semiconductor
    • International Technology Roadmap for Semiconductor 2011, www.itrs.net/Links/2011ITRS/Home2011.htm.
    • (2011)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.