Elucidating the photoresponse of ultrathin MoS2 field-effect transistors by scanning photocurrent microscopy

Journal of Physical Chemistry Letters

Volumn 4, Issue 15, 2013, Pages 2508-2513

  Wu, Chung Chiang ^a   Jariwala, Deep ^a   Sangwan, Vinod K ^a   Marks, Tobin J ^a,b   Hersam, Mark C ^a,b   Lauhon, Lincoln J ^a  

^a Northwestern University   (United States)

^b NORTHWESTERN UNIVERSITY   (United States)

Author keywords

MoS2; nanoelectronics; scanning photocurrent microscopy; transition metal dichalcogenides

Indexed keywords

EXTERNAL ELECTRIC FIELD; INTERBAND PHOTOEXCITATION; MOLYBDENUM DISULFIDE; MOS2; PHOTOCURRENT MEASUREMENT; PHOTOEXCITED CARRIERS; SCANNING PHOTOCURRENT MICROSCOPIES; TRANSITION METAL DICHALCOGENIDES;

ELECTRIC FIELDS; FIELD EFFECT TRANSISTORS; MOLYBDENUM COMPOUNDS; NANOELECTRONICS; SCANNING; SEMICONDUCTOR QUANTUM WELLS;

PHOTOCURRENTS;

EID: 84881303838     PISSN: None     EISSN: 19487185     Source Type: Journal    
DOI: 10.1021/jz401199x     Document Type: Article

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