Imaging of the schottky barriers and charge depletion in carbon nanotube transistors

Nano Letters

Volumn 7, Issue 7, 2007, Pages 2037-2042

  Freitag, Marcus ^a   Tsang, James C ^a   Bol, Ageeth ^a   Yuan, Dongning ^b   Liu, Jie ^b   Avouris, Phaedon ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b DUKE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE DEPLETION; METAL CONTACT; PHOTOVOLTAGE SWITCHES;

CARBON NANOTUBES; PHOTOCURRENTS; PHOTOEMISSION; SCHOTTKY BARRIER DIODES;

FIELD EFFECT TRANSISTORS;

CARBON NANOTUBE; PALLADIUM;

CHEMISTRY; ELECTROCHEMISTRY; PHOTOCHEMISTRY; REVIEW; SEMICONDUCTOR;

ELECTROCHEMISTRY; NANOTUBES, CARBON; PALLADIUM; PHOTOCHEMISTRY; TRANSISTORS;

EID: 34547215275     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl070900e     Document Type: Article

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