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Volumn 52, Issue 6 PART 1, 2013, Pages
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High-performance amorphous indium oxide thin-film transistors fabricated by an aqueous solution process at low temperature
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS INDIUM-OXIDE;
ANNEALING TEMPERATURES;
ELECTRICAL CHARACTERISTIC;
ELECTRICAL PERFORMANCE;
FABRICATION TECHNIQUE;
ON/OFF CURRENT RATIO;
SATURATION MOBILITY;
THIN-FILM TRANSISTOR (TFTS);
ANNEALING;
INDIUM;
TEMPERATURE;
THIN FILM TRANSISTORS;
SOLUTIONS;
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EID: 84881084061
PISSN: 00214922
EISSN: 13474065
Source Type: Journal
DOI: 10.7567/JJAP.52.060204 Document Type: Article |
Times cited : (19)
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References (27)
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