Stable, solution-processed, high-mobility ZnO thin-film transistors

Journal of the American Chemical Society

Volumn 129, Issue 10, 2007, Pages 2750-2751

  Ong, Beng S ^a   Li, Chensha ^b   Li, Yuning ^a   Wu, Yiliang ^a   Loutfy, Rafik ^b  

^a XEROX RESEARCH CENTRE OF CANADA   (Canada)

^b MCMASTER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

ARTICLE; CRYSTALLIZATION; DIFFERENTIAL SCANNING CALORIMETRY; FILM; SCANNING ELECTRON MICROSCOPE; SEMICONDUCTOR; THERMOGRAVIMETRY; X RAY DIFFRACTION;

EID: 33947251640     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja068876e     Document Type: Article

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