Low-temperature aqueous solution processed fluorine-doped zinc tin oxide thin-film transistors

MRS Communications

Volumn 2, Issue 1, 2012, Pages 17-22

  Jeon, Jun Hyuck ^a   Hwang, Young Hwan ^a   Jin, Jungho ^a   Bae, Byeong Soo ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85011457798     PISSN: 21596859     EISSN: 21596867     Source Type: Journal    
DOI: 10.1557/mrc.2012.1     Document Type: Article

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