![]() |
Volumn 43, Issue 4, 2010, Pages
|
Structural characterization of indium oxide nanostructures: A Raman analysis
|
Author keywords
[No Author keywords available]
|
Indexed keywords
DISORDER EFFECT;
HIGH QUALITY SINGLE CRYSTALS;
INDIUM OXIDE;
PHONON MODE;
RAMAN ANALYSIS;
RAMAN SELECTION RULES;
SN-DOPED;
STRUCTURAL CHARACTERIZATION;
STRUCTURAL INFORMATION;
DOPING (ADDITIVES);
NANOWIRES;
PHONONS;
QUALITY CONTROL;
RAMAN SPECTROSCOPY;
TIN;
TITANIUM COMPOUNDS;
SINGLE CRYSTALS;
|
EID: 76749121430
PISSN: 00223727
EISSN: 13616463
Source Type: Journal
DOI: 10.1088/0022-3727/43/4/045401 Document Type: Article |
Times cited : (155)
|
References (27)
|