메뉴 건너뛰기




Volumn 39, Issue 7, 2013, Pages 7677-7683

The optical properties of hydrophilic Hf-doped HfO2 nanoceramic films

Author keywords

Film; Hydrophilicity; Sputtering; Transmission

Indexed keywords

DC MAGNETRON SPUTTERING; HF-DOPED; NANO CERAMICS; NEAR INFRARED REGION; OXIDATION STATE; RF-MAGNETRON SPUTTERING; ULTRAVIOLET REGION;

EID: 84880321414     PISSN: 02728842     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ceramint.2013.03.020     Document Type: Article
Times cited : (23)

References (43)
  • 3
    • 22144476901 scopus 로고    scopus 로고
    • Crystalline phases, microstructures and electrical properties of hafnium oxide films deposited by sol-gel method
    • Z.J. Wang, T. Kumagai, H. Kokawa, J. Tsuaur, M. Ichiki, and R. Maeda Crystalline phases, microstructures and electrical properties of hafnium oxide films deposited by sol-gel method Journal of Crystal Growth 281 2005 452 457
    • (2005) Journal of Crystal Growth , vol.281 , pp. 452-457
    • Wang, Z.J.1    Kumagai, T.2    Kokawa, H.3    Tsuaur, J.4    Ichiki, M.5    Maeda, R.6
  • 4
    • 33847371952 scopus 로고    scopus 로고
    • Synthesis and characterization of hafnium oxide and hafnium aluminate ultra-thin films by a sol-gel spin coating process for microelectronic applications
    • A.R. Phani, M. Passacantando, and S. Santucci Synthesis and characterization of hafnium oxide and hafnium aluminate ultra-thin films by a sol-gel spin coating process for microelectronic applications Journal of Non-Crystalline Solids 353 2007 663 669
    • (2007) Journal of Non-Crystalline Solids , vol.353 , pp. 663-669
    • Phani, A.R.1    Passacantando, M.2    Santucci, S.3
  • 8
    • 33751219223 scopus 로고    scopus 로고
    • 2 films prepared by dc reactive magnetron sputtering
    • 2 films prepared by dc reactive magnetron sputtering Applied Surface Science 253 2006 2143 2147
    • (2006) Applied Surface Science , vol.253 , pp. 2143-2147
    • Liu, X.1    Li, D.2
  • 10
    • 33244455230 scopus 로고    scopus 로고
    • Characterization of hafnium oxide grown on silicon by atomic layer deposition: Interface structure
    • A. Deshpande, R. Inman, G. Jursich, and C. Takoudis Characterization of hafnium oxide grown on silicon by atomic layer deposition: interface structure Microelectronic Engineering 83 2006 547 552
    • (2006) Microelectronic Engineering , vol.83 , pp. 547-552
    • Deshpande, A.1    Inman, R.2    Jursich, G.3    Takoudis, C.4
  • 11
    • 70350036065 scopus 로고    scopus 로고
    • 2 thin films prepared by RF magnetron sputtering
    • 2 thin films prepared by RF magnetron sputtering Materials Chemistry and Physics 118 2009 349 353
    • (2009) Materials Chemistry and Physics , vol.118 , pp. 349-353
    • Meng, F.1    Sun, Z.2
  • 12
    • 0005762811 scopus 로고    scopus 로고
    • Highly oriented ZnO thin films deposited on Ru/Si substrates
    • W.T. Lim, and C.H. Lee Highly oriented ZnO thin films deposited on Ru/Si substrates Thin Solid Films 353 1999 12 15
    • (1999) Thin Solid Films , vol.353 , pp. 12-15
    • Lim, W.T.1    Lee, C.H.2
  • 23
  • 24
  • 25
    • 0031702268 scopus 로고    scopus 로고
    • Annealing effects on opto-electronic properties of sputtered and thermally evaporated indium-tin-oxide films
    • D.V. Morgan, Y.H. Aliyu, R.W. Bunce, and A. Salehi Annealing effects on opto-electronic properties of sputtered and thermally evaporated indium-tin-oxide films Thin Solid Films 312 1998 268 272
    • (1998) Thin Solid Films , vol.312 , pp. 268-272
    • Morgan, D.V.1    Aliyu, Y.H.2    Bunce, R.W.3    Salehi, A.4
  • 28
    • 0033534984 scopus 로고    scopus 로고
    • Properties of aluminium oxide thin films deposited by reactive magnetron sputtering
    • K. Koski, J. Hölsä, and P. Juliet Properties of aluminium oxide thin films deposited by reactive magnetron sputtering Thin Solid Films 339 1999 240 248
    • (1999) Thin Solid Films , vol.339 , pp. 240-248
    • Koski, K.1    Hölsä, J.2    Juliet, P.3
  • 30
    • 0035965968 scopus 로고    scopus 로고
    • Stress and morphological development of CdS and ZnS thin films during the SILAR growth on (100) GaAs
    • G. Laukaitis, S. Lindroos, S. Tamulevičius, and M. Leskelä Stress and morphological development of CdS and ZnS thin films during the SILAR growth on (100) GaAs Applied Surface Science 185 2001 134 139
    • (2001) Applied Surface Science , vol.185 , pp. 134-139
    • Laukaitis, G.1    Lindroos, S.2    Tamulevičius, S.3    Leskelä, M.4
  • 31
    • 0000095221 scopus 로고
    • A quantitative model for the evolution from random orientation to a unique texture in PVD thin film growth
    • G. Knuyt, C. Quaeyhaegens, J. D'Haen, and L.M. Stals A quantitative model for the evolution from random orientation to a unique texture in PVD thin film growth Thin Solid Films 258 1995 159 169
    • (1995) Thin Solid Films , vol.258 , pp. 159-169
    • Knuyt, G.1    Quaeyhaegens, C.2    D'Haen, J.3    Stals, L.M.4
  • 32
    • 0039416064 scopus 로고    scopus 로고
    • A model for thin film texture evolution driven by surface energy effects
    • G. Knuyt, C. Quaeyhaegens, J. D'Haen, and L.M. Stals A model for thin film texture evolution driven by surface energy effects Physica Status Solidi B 195 1996 179 193
    • (1996) Physica Status Solidi B , vol.195 , pp. 179-193
    • Knuyt, G.1    Quaeyhaegens, C.2    D'Haen, J.3    Stals, L.M.4
  • 33
    • 0032045625 scopus 로고    scopus 로고
    • Fundamental structure forming phenomena of polycrystalline films and the structure zone models
    • P.B. Barna, and M. Adamik Fundamental structure forming phenomena of polycrystalline films and the structure zone models Thin Solid Films 317 1998 27 33
    • (1998) Thin Solid Films , vol.317 , pp. 27-33
    • Barna, P.B.1    Adamik, M.2
  • 34
    • 0019024175 scopus 로고
    • Characterization of ZnO piezoelectric films prepared by rf planar-magnetron sputtering
    • T. Yamamoto, T. Shiosaki, and A. Kawabata Characterization of ZnO piezoelectric films prepared by rf planar-magnetron sputtering Journal of Applied Physics 51 6 1980 3113 3120
    • (1980) Journal of Applied Physics , vol.51 , Issue.6 , pp. 3113-3120
    • Yamamoto, T.1    Shiosaki, T.2    Kawabata, A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.