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Thin Solid Films

Volumn 292, Issue 1-2, 1997, Pages 184-188

Grain sizes of Ni films measured by STM and X-ray methods

(4) Wang, Deliang a Geyer, U a Schneider, S a Von Minnigerode, G a

a UNIVERSITY OF GÖTTINGEN (Germany)

Author keywords

Growth mechanism; Nickel; Scanning tunneling microscopy; X rays

Indexed keywords

ANNEALING; CRYSTAL DEFECTS; GRAIN SIZE AND SHAPE; NICKEL; NICKEL ALLOYS; SCANNING TUNNELING MICROSCOPY; SUBSTRATES; SURFACE ROUGHNESS; SURFACES; X RAY DIFFRACTION; X RAYS;

NICKEL YTTRIUM ALLOYS; SAPPHIRE SUBSTRATES;

THIN FILMS;

EID: 0031553459 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(96)08963-8 Document Type: Article

Times cited : (17)

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