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Volumn 3, Issue 3, 2013, Pages 930-935

Aluminum oxide deposited by pulsed-DC reactive sputtering for crystalline silicon surface passivation

Author keywords

Aluminum oxide; crystalline silicon solar cells; pulsed dc reactive sputtering; surface passivation

Indexed keywords

ALUMINUM OXIDES; CROSS SECTIONAL TRANSMISSION ELECTRON MICROSCOPY; CRYSTALLINE SILICON SURFACES; CRYSTALLINE SILICONS; POST DEPOSITION ANNEALING; PULSED DC; SURFACE PASSIVATION; SURFACE RECOMBINATION VELOCITIES;

EID: 84880053979     PISSN: 21563381     EISSN: None     Source Type: Journal    
DOI: 10.1109/JPHOTOV.2013.2251057     Document Type: Article
Times cited : (19)

References (34)
  • 1
    • 84863709682 scopus 로고    scopus 로고
    • 3-based surface passivation schemes for silicon solar cells
    • 3-based surface passivation schemes for silicon solar cells, " J. Vac. Sci. Technol., A, vol. 30, pp. 040802-1-040802-27, 2012.
    • (2012) J. Vac. Sci. Technol., A , vol.30 , pp. 04080201-04080227
    • Dingemans, G.1    Kessels, W.M.M.2
  • 5
    • 33748331191 scopus 로고    scopus 로고
    • Very low surface recombination velocities on p-type silicon wafers passivated with a dielectric with fixed negative charge
    • DOI 10.1016/j.solmat.2006.04.014, PII S0927024806002704
    • G. Agostinelli, A. Delabie, P. Vitanov, Z. Alexieva, H. F. W. Dekkers, S. De Wolf, and G. Beaucarne, "Very low surface recombination velocities on p-type silicon wafers passivated with a dielectric with fixed negative charge, " Sol. Energy Mater. Sol. Cells, vol. 90, pp. 3438-3443, 2006. (Pubitemid 44332126)
    • (2006) Solar Energy Materials and Solar Cells , vol.90 , Issue.18-19 , pp. 3438-3443
    • Agostinelli, G.1    Delabie, A.2    Vitanov, P.3    Alexieva, Z.4    Dekkers, H.F.W.5    De Wolf, S.6    Beaucarne, G.7
  • 6
    • 77958487280 scopus 로고    scopus 로고
    • Very low surface recombination velocities on p-and n-type c-Si by ultrafast spatial atomic layer deposition of aluminum oxide
    • F. Werner, B. Veith, V. Tiba, P. Poodt, F. Roozeboom, R. Brendel, and J. Schmidt, "Very low surface recombination velocities on p-and n-type c-Si by ultrafast spatial atomic layer deposition of aluminum oxide, " Appl. Phys. Lett., vol. 97, pp. 162103-1-162103-3, 2010.
    • (2010) Appl. Phys. Lett. , vol.97 , pp. 1621031-1621033
    • Werner, F.1    Veith, B.2    Tiba, V.3    Poodt, P.4    Roozeboom, F.5    Brendel, R.6    Schmidt, J.7
  • 10
    • 77955720046 scopus 로고    scopus 로고
    • High-speed spatial atomic-layer deposition of aluminum oxide layers for solar cell passivation
    • P. Poodt, A. Lankhorst, F. Roozeboom, K. Spee, D. Maas, and A. Vermeer, "High-speed spatial atomic-layer deposition of aluminum oxide layers for solar cell passivation, " Adv. Mater., vol. 22, pp. 3564-3567, 2010.
    • (2010) Adv. Mater. , vol.22 , pp. 3564-3567
    • Poodt, P.1    Lankhorst, A.2    Roozeboom, F.3    Spee, K.4    Maas, D.5    Vermeer, A.6
  • 13
    • 74849108283 scopus 로고    scopus 로고
    • High quality aluminum oxide passivation layer for crystalline silicon solar cells deposited by parallel-plate plasma-enhanced chemical vapor deposition
    • S. Miyajima, J. Irikawa, A. Yamada, and M. Konagai, "High quality aluminum oxide passivation layer for crystalline silicon solar cells deposited by parallel-plate plasma-enhanced chemical vapor deposition, " Appl. Phys. Exp., vol. 3, pp. 012301-1-012301-3, 2010.
    • (2010) Appl. Phys. Exp. , vol.3 , pp. 0123011-0123013
    • Miyajima, S.1    Irikawa, J.2    Yamada, A.3    Konagai, M.4
  • 18
    • 84871725573 scopus 로고    scopus 로고
    • x and improved surface passivation of crystalline silicon
    • Jan
    • x and improved surface passivation of crystalline silicon, " IEEE J. Photovolt., vol. 3, no. 1, pp. 183-188, Jan. 2013.
    • (2013) IEEE J. Photovolt. , vol.3 , Issue.1 , pp. 183-188
    • Zhang, X.1    Cuevas, A.2    Thomson, A.3
  • 19
    • 70350217133 scopus 로고    scopus 로고
    • Effective surface passivation of crystalline silicon by rf sputtered aluminum oxide
    • T.-T. Li and A. Cuevas, "Effective surface passivation of crystalline silicon by rf sputtered aluminum oxide, " Phys. Status Solidi-Rapid Res. Lett., vol. 3, pp. 160-162, 2009.
    • (2009) Phys. Status Solidi-Rapid Res. Lett. , vol.3 , pp. 160-162
    • Li, T.-T.1    Cuevas, A.2
  • 23
    • 0019056629 scopus 로고
    • Single-frequency approximation for interface-state density determination
    • W. A. Hill and C. C. Coleman, "A single-frequency approximation for interface state density determination, " Solid State Electron., vol. 23, pp. 987-993, 1980. (Pubitemid 11454475)
    • (1980) Solid-State Electronics , vol.23 , Issue.9 , pp. 987-993
    • Hill, W.A.1    Coleman, C.C.2
  • 24
    • 0000020111 scopus 로고    scopus 로고
    • Accurate method for the determination of bulk minority-carrier lifetimes of mono- and multicrystalline silicon wafers
    • J. Schmidt and A. G. Aberle, "Accurate method for the determination of bulk minority-carrier lifetimes of mono-and multicrystalline silicon wafers, " J. Appl. Phys., vol. 81, pp. 6186-6199, 1997. (Pubitemid 127572676)
    • (1997) Journal of Applied Physics , vol.81 , Issue.9 , pp. 6186-6199
    • Schmidt, J.1    Aberle, A.G.2
  • 25
    • 0036139271 scopus 로고    scopus 로고
    • Generalized analysis of quasi-steady-state and transient decay open circuit voltage measurements
    • M. J. Kerr, A. Cuevas, and R. A. Sinton, "Generalized analysis of quasi-steady-state and transient decay open circuit voltage measurements, " J. Appl. Phys., vol. 91, pp. 399-404, 2002.
    • (2002) J. Appl. Phys. , vol.91 , pp. 399-404
    • Kerr, M.J.1    Cuevas, A.2    Sinton, R.A.3
  • 31
    • 0036655951 scopus 로고    scopus 로고
    • Effective electron mobility reduced by remote charge scattering in high-κ gate stacks
    • M. Hiratani, S. Saito, Y. Shimamoto, and K. Torii, "Effective electron mobility reduced by remote charge scattering in high-κ gate stacks, " Jpn. J. Appl. Phys., vol. 41, pp. 4521-4522, 2002.
    • (2002) Jpn. J. Appl. Phys. , vol.41 , pp. 4521-4522
    • Hiratani, M.1    Saito, S.2    Shimamoto, Y.3    Torii, K.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.