Accurate method for the determination of bulk minority-carrier lifetimes of mono- and multicrystalline silicon wafers

Journal of Applied Physics

Volumn 81, Issue 9, 1997, Pages 6186-6199

  Schmidt, Jan ^a   Aberle, Armin G ^a  

^a INSTITUTE FOR SOLAR ENERGY RESEARCH HAMELIN ISFH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000020111     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.364403     Document Type: Article

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