Generalized analysis of quasi-steady-state and transient decay open circuit voltage measurements

Journal of Applied Physics

Volumn 91, Issue 1, 2002, Pages 399-404

  Kerr, Mark J ^a   Cuevas, Andres ^a   Sinton, Ronald A ^b  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^b Sinton Consulting Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEVICE CHARACTERISTICS; HIGH RESISTIVITY SILICON DEVICES; MINORITY CARRIER LIFETIMES; PHOTOCONDUCTANCE; QUASI-STEADY STATE; TRANSIENT DECAY; TRANSIENT TECHNIQUES; VARYING LIGHTS;

OPEN CIRCUIT VOLTAGE; SLOW LIGHT;

CURRENT VOLTAGE CHARACTERISTICS;

EID: 0036139271     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1416134     Document Type: Article

References (9)

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