Stability and spacial trap state distribution of solution processed ZnO-thin film transistors

Journal of Applied Physics

Volumn 113, Issue 15, 2013, Pages

  Ortel, Marlis ^a   Pittner, Steve ^a   Wagner, Veit ^a  

^a JACOBS UNIVERSITY BREMEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BIAS STRESS STABILITIES; CHARGE SEPARATIONS; CHARGE TRANSPORT PROCESS; INTERACTIONS WITH SURFACES; LONG-TERM STORAGE STABILITY; PERCOLATION THRESHOLDS; TRAP STATE DISTRIBUTIONS; ZINC OXIDE THIN FILMS;

FILM THICKNESS; SOLVENTS; SPRAY PYROLYSIS; THIN FILM TRANSISTORS; THIN FILMS; ZINC OXIDE;

STABILITY;

EID: 84877757915     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4801892     Document Type: Article

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