Mid-infrared near-field spectroscopy

Optics Express

Volumn 17, Issue 24, 2009, Pages 21794-21801

  Amarie, Sergiu ^a   Ganz, Thomas ^a   Keilmann, Fritz ^a  

^a MAX PLANCK INSTITUT FÜR QUANTENOPTIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; MICHELSON INTERFEROMETERS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; SILICON CARBIDE;

AFM CANTILEVERS; BROADBAND ILLUMINATION; DISPERSIVE FOURIER TRANSFORMS; INFRARED SPECTRUM; NEAR FIELD MICROSCOPY; NEAR-FIELD SPECTROSCOPY; PHONON RESONANCE; SCATTERING EFFICIENCY;

FOURIER TRANSFORM INFRARED SPECTROSCOPY;

ARTICLE; ATOMIC FORCE MICROSCOPY; EQUIPMENT DESIGN; FOURIER ANALYSIS; IMAGE PROCESSING; INFRARED SPECTROPHOTOMETRY; INSTRUMENTATION; INTERFEROMETRY; LASER; METHODOLOGY; OPTICS; RADIATION SCATTERING; REPRODUCIBILITY;

EQUIPMENT DESIGN; FOURIER ANALYSIS; IMAGE PROCESSING, COMPUTER-ASSISTED; INTERFEROMETRY; LASERS; MICROSCOPY, ATOMIC FORCE; OPTICS AND PHOTONICS; REPRODUCIBILITY OF RESULTS; SCATTERING, RADIATION; SPECTROPHOTOMETRY, INFRARED;

EID: 72449204124     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.021794     Document Type: Article

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