Scanning transmission electron microscopy: Albert Crewe's vision and beyond

Ultramicroscopy

Volumn 123, Issue , 2012, Pages 90-98

  Krivanek, Ondrej L ^a   Chisholm, Matthew F ^b   Murfitt, Matthew F ^a   Dellby, Niklas ^a  

^a Nion Co Kirkland   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Aberration correction; ADF imaging; EELS; Single atom imaging; Single atom spectroscopy; STEM

Indexed keywords

ABERRATION CORRECTION; ATOMIC BONDING; ATOMIC RESOLUTION; ATOMIC-RESOLUTION IMAGING; FUTURE CHALLENGES; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SINGLE ATOM SPECTROSCOPY; SINGLE ATOMS; STEM; STEM DEVELOPMENT;

ATOMIC SPECTROSCOPY; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONIC PROPERTIES; TRANSMISSION ELECTRON MICROSCOPY;

ATOMS;

CARBON; GOLD; DNA;

ARTICLE; ATOM; ELECTRIC CURRENT; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONICS; IMAGE PROCESSING; MOLECULAR IMAGING; MOLECULAR PROBE; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SPECTROSCOPY; ELECTRON; EQUIPMENT; METHODOLOGY; REVIEW; BASE PAIRING; DNA SEQUENCE; ENERGY TRANSFER; IMAGE ANALYSIS; IONIZATION;

ELECTRONS; MICROSCOPY, ELECTRON, SCANNING TRANSMISSION;

EID: 84870408467     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.04.004     Document Type: Article

References (55)

1. Crewe A.V., Wall J., Welter L.M. Journal of Applied Physics 1968, 39:5861.
2. Crewe A.V., Isaacson M., Johnson D.E. Review of Scientific Instruments 1969, 40:241.
3. Crewe A.V., Wall J. Journal of Molecular Biology 1970, 48:375.
4. Crewe A.V. Microscopy and Microanalysis 2004, 10:414.
5. Crewe A.V. Cold field emission and the scanning transmission electron microscope. Advances in Imaging & Electron Physics 2009, vol. 159:1. Elsevier, Amsterdam.
6. Crewe A.V., Wall J., Langmore J. Science 1970, 168:1338.
7. Isaacson M., Johnson D.E. Ultramicroscopy 1975, 1:33.
8. Crewe A.V. in: Proceedings of the 47th Nobel Symposium. Chemica Scripta 1979, 14:17.
9. Isaacson M., Kopf D., Utlaut M., Parker N.W., Crewe A.V. Proceedings of the National Academy of Sciences of the United States of America 1977, 74:1802.
10. Binnig G., Rohrer H. Reviews of Modern Physics 1987, 59:615.
11. Eigler D.M., Schweizer E.K. Nature 1990, 344:524.
12. Ward B., Notte J.A., Economou N.P. Photonics Spectra 2007, Available from:. http://www.photonics.com/Article.aspx?AID=30461.
13. Pennycook S.J. Scanning Transmission Electron Microscopy 2011, 1. Springer. S.J. Pennycook, P.D. Nellist (Eds.).
14. Dellby N., Bacon N.J., Hrncirik P., Murfitt M.F., Skone G.S., Szilagyi Z.S., Krivanek O.L. European Physical Journal: Applied Physics 2011, 54:33505.
15. Treacy M.M.J., Howie A., Wilson C.J. Philosophical Magazine A 1978, 38:569.
16. Howie A. Journal of Microscopy 1979, 117:11.
17. Hartel P., Rose H., Dignes C. Ultramicroscopy 1996, 63:93.
18. Crewe A.V., Langmore J.P., Isaacson M.S. Physical Aspects of Electron Microscopy and Microbeam Analysis 1975, 47. Wiley, New York. B.M. Siegel, D.R. Beaman (Eds.).
19. Treacy M.M.J. Microscopy and Microanalysis 2011, 17:847.
20. Krivanek O.L., Corbin G.J., Dellby N., Elston B.F., Keyse R.J., Murfitt M.F., Own C.S., Szilagyi Z.S., Woodruff J.W. Ultramicroscopy 2008, 108:179.
21. http://www.nion.com.
22. Krivanek O.L., Dellby N., Murfitt M.F., Chisholm M.F., Pennycook T.J., Suenaga K., Nicolosi V. Ultramicroscopy 2010, 110:935.
23. J. Wall, J.P. Langmore, in: Proceedings of the 28th EMSA Meeting, Houston, Texas, 1970, p. 252.
24. J.P. Langmore, A.V. Crewe, in: Proceedings of the 32nd EMSA Meeting, St. Louis, Miss., 1974, p. 376.
25. Bell D.C., Thomas W., Murtagh K., Glover W.R. Microscopy and Microanalysis 2010, 16(Suppl. S2):1768.
26. Bleloch A.L., Own C.S., Hamalainen M., Hershleb J., Kemmish K., Koene R., Stark H., Stark J., Andregg M., Andregg W. Microscopy and Microanalysis 2011, 17(Suppl. S2):1274.
27. Bell D.C., Thomas W.K., Murtagh K., Glover W. Microscopy and Microanalysis 2011, 17(Suppl. S2):1276.
28. Schadt E.E., Turner S., Kasarskis A. Human Molecular Genetics 2010, 19(Review Issue 2):R227.
29. Zobelli A., Gloter A., Ewels C.P., Seifert G., Colliex C. Physical Review B 2007, 75:245402.
30. Egerton R.F. EELS in the Electron Microscope 2011, Springer, New York and Heidelberg. 3rd edition.
31. Krivanek O.L., Chisholm M.F., Nicolosi V., Pennycook T.J., Corbin G.J., Dellby N., Murfitt M.F., Own C.S., Szilagyi Z.S., Oxley M.P., Pantelides S.T., Pennycook S.J. Nature 2010, 464:571.
32. Wall J., Langmore J., Isaacson M., Crewe A.V. Proceedings of the National Academy of Sciences of the United States of America 1974, 71:1-5.
33. Sasaki T., Sawada H., Hosokawa F., Kohno Y., Tomita T., Kaneyama T., Kondo Y., Kimoto K., Sato Y., Suenaga K. Journal of Electron Microscopy 2010, 59(Supplement):S7.
34. Krivanek O.L., Chisholm M.F., Dellby N., Murfitt M.F. Scanning Transmission Electron Microscopy 2011, 615. Springer. S.J. Pennycook, P.D. Nellist (Eds.).
35. Kirkland Earl J. Ultramicroscopy 2011, 111:1523.
36. O.L. Krivanek, W. Zhou, M.F. Chisholm, N. Dellby, T.C. Lovejoy, Q.M. Ramasse, J.-C. Idrobo, in: D.C. Bell, N. Erdman (Eds.), Low Voltage Transmission Electron Microscopy, RMS Wiley, in print.
37. Jinschek J.R., Yucelen E., Calderon H.A., Freitag B. Carbon 2011, 49:556.
38. Urban K. Nature Materials 2011, 10:165-166.
39. http://www.wiredchemist.com/chemistry/data/bond_energies_lengths.html.
40. Kresse G., Furthmüller J. Physical Review 1996, B54:11169.
41. J.-C. Idrobo, Private Communication.
42. M.F. Chisholm, et al., in preparation.
43. Zan R., Bangert U., Ramasse Q., Novoselov K.S. Nano Letters 2011, 11:1087.
44. Zan R., Bangert U., Ramasse Q., Novoselov K.S. Small 2011, 7:2868.
45. Krivanek O.L., Mory C., Tence M., Colliex C. Microscopy Microanalysis Microstructures 1991, 2:257.
46. Suenaga K., Tence M., Mory C., Colliex C., Kato H., Okazaki T., Shinohara H., Hirahara K., Bandow S., Iijima S. Science 2000, 290:2280.
47. Suenaga K., Iizumi Y., Okazaki T. European Physical Journal Applied Physics 2011, 54:33508.
48. Varela M., Findlay S.D., Lupini A.R., Christen H.M., Borisevich A.Y., Dellby N., Krivanek O.L., Nellist P.D., Oxley M.P., Allen L.J., Pennycook S.J. Physical Review Letters 2004, 92:095502.
49. Muller D.A., Fitting Kourkoutis L., Murfitt M.F., Song J.H., Hwang H.Y., Silcox J., Dellby N., Krivanek O.L. Science 2008, 319:1073.
50. Botton G.A., Lazar S., Dwyer C. Ultramicroscopy 2010, 110:926.
51. Varela M., Gasquez J., Pennycook T.J., Magen C., Oxley M.P., Pennycook S.J. Scanning Transmission Electron Microscopy 2011, 429. Springer. S.J. Pennycook, P.D. Nellist (Eds.).
52. Erni R., Rosell M.D., Nguyen M.-T., Blankenburg S., Passerone D., Hartel P., Alem N., Erickson K., Gannett W., Zettl A. Physical Review 2010, B82:165433.
53. Lovejoy T.C., Ramasse Q., Falke M., Kaeppel A., Terborg R., Zan R., Dellby N., Krivanek O.L. Applied Physics Letters 2012, 100:154101.
54. K. Suenaga, K. Okazaki, E. Okunishi, S. Matsumura, Nature Photonics, in print.
55. Krivanek O.L., Ursin J.P., Bacon N.J., Corbin G.J., Dellby N., Hrncirik P., Murfitt M.F., Own C.S., Szilagyi Z.S. Philosophical Transactions of the Royal Society of London A 2009, 367:3683.