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Applied Physics Letters

Volumn 102, Issue 13, 2013, Pages

Measurement of specific contact resistivity using scanning voltage probes

(2) Wang, Weigang a Beasley, Malcolm R a

a STANFORD UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPLICATED GEOMETRY; EXPERIMENTAL DATUM; MODEL CALCULATIONS; PARASITIC RESISTANCES; POTENTIAL VARIATIONS; SAMPLE SURFACE; SCANNING KELVIN PROBES; SPECIFIC CONTACT RESISTIVITY;

GRAPHENE; SCANNING;

PROBES;

EID: 84876103722 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4796175 Document Type: Article

Times cited : (6)

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