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Applied Physics Letters

Volumn 86, Issue 12, 2005, Pages 1-3

Potential mapping of pentacene thin-film transistors using purely electric atomic-force-microscope potentiometry

(5) Nakamura, Masakazu a Goto, Naoyuki a Ohashi, Noboru a Sakai, Masatoshi a Kudo, Kazuhiro a

a CHIBA UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CONTACTS; GRAIN BOUNDARIES; INTERFACES (MATERIALS); NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; PLASTIC FILMS; SUBSTRATES;

KELVIN PROBE FORCE MICROSCOPY (KPFM); ORGANIC THIN FILM TRANSISTORS; POTENTIOMETRY; TAPPING-MODE OPERATIONS;

THIN FILM TRANSISTORS;

EID: 17944365907 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1891306 Document Type: Article

Times cited : (74)

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