Specific contact resistivity of nanowire devices

Applied Physics Letters

Volumn 88, Issue 5, 2006, Pages 1-3

  Stern, E ^a   Cheng, G ^a   Young, M P ^a   Reed, M A ^a  

^a YALE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MULTITERMINAL KELVIN MEASUREMENTS; NANOWIRE DEVICES; PROCESS-INDEPENDENT; SPECIFIC CONTACT RESISTIVITY;

CARRIER CONCENTRATION; ELECTRIC CONDUCTIVITY; MEASUREMENT THEORY; SEMICONDUCTOR DEVICES;

NANOSTRUCTURED MATERIALS;

EID: 31944437025     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2163454     Document Type: Article

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