Measuring the specific contact resistance of contacts to semiconductor nanowires

Solid-State Electronics

Volumn 49, Issue 2, 2005, Pages 227-232

  Mohney, S E ^a   Wang, Y ^b   Cabassi, M A ^b   Lew, K K ^a   Dey, S ^a   Redwing, J M ^a   Mayer, T S ^b  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b The Pennsylvania State University   (United States)

Author keywords

Contact resistivity; Nanocontact; Nanowire; Ohmic contact; Specific contact resistance

Indexed keywords

CHEMICAL SENSORS; COMPUTER SIMULATION; ELECTRIC LINES; ELECTRIC RESISTANCE; FIELD EFFECT TRANSISTORS; NANOSTRUCTURED MATERIALS; OHMIC CONTACTS; SILICON;

CONTACT RESISTIVITY; NANOCONTACT; NANOWIRE; SPECIFIC CONTACT RESISTANCE;

SEMICONDUCTOR MATERIALS;

EID: 9544225077     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2004.08.006     Document Type: Article

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