Potentiometry and repair of electrically stressed nanowires using atomic force microscopy

Applied Physics Letters

Volumn 72, Issue 8, 1998, Pages 915-917

  Hersam, M C ^a   Hoole, A C F ^a   O'Shea, S J ^a   Welland, M E ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000446759     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120872     Document Type: Article

References (13)

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