Synthesis of nanowires via helium and neon focused ion beam induced deposition with the gas field ion microscope

Nanotechnology

Volumn 24, Issue 17, 2013, Pages

  Wu, H M ^a   Stern, L A ^a   Chen, J H ^b   Huth, M ^c   Schwalb, C H ^c   Winhold, M ^c   Porrati, F ^c   Gonzalez, C M ^d   Timilsina, R ^d   Rack, P D ^b,d  

^a CARL ZEISS SMT AG   (Germany)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c GOETHE UNIVERSITY   (Germany)

^d University of Tennessee   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BEAM-INDUCED DEPOSITION; ELECTRICAL BEHAVIORS; ELECTRON BEAM-INDUCED DEPOSITION; FOCUSED ION BEAM INDUCED DEPOSITION; INTER-GRAIN COUPLINGS; PLATINUM NANO-PARTICLES; ROOM-TEMPERATURE RESISTIVITY; TEMPERATURE DEPENDENT;

AMORPHOUS CARBON; DEPOSITS; ELECTRON BEAMS; GAS INDUSTRY; HELIUM; ION BEAMS; MICROSCOPES; MONTE CARLO METHODS; NANOWIRES;

PLATINUM;

EID: 84876103133     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/24/17/175302     Document Type: Article

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