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Volumn 2009, Issue , 2009, Pages

Origin of the difference in the resistivity of as-grown focused-ion- and focused-electron-beam-induced Pt nanodeposits

Author keywords

[No Author keywords available]

Indexed keywords


EID: 65649122635     PISSN: 16874110     EISSN: 16874129     Source Type: Journal    
DOI: 10.1155/2009/936863     Document Type: Article
Times cited : (83)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.