Synchrotron radiation-based far-infrared spectroscopic ellipsometer with full Mueller-matrix capability

Review of Scientific Instruments

Volumn 84, Issue 2, 2013, Pages

  Stanislavchuk, T N ^a   Kang, T D ^a   Rogers, P D ^a   Standard, E C ^a   Basistyy, R ^a   Kotelyanskii, A M ^a,b   Nita, G ^a   Zhou, T ^a   Carr, G L ^c   Kotelyanskii, M ^a,d   Sirenko, A A ^a  

^a NEW JERSEY INSTITUTE OF TECHNOLOGY   (United States)

^b ALLEGHENY COLLEGE   (United States)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

^d RUDOLPH TECHNOLOGIES INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BROOKHAVEN NATIONAL LABORATORY; CRYSTALLOGRAPHIC ORIENTATIONS; FOURIER TRANSFORM INFRA REDS; NATIONAL SYNCHROTRON LIGHT SOURCES; NON-LINEAR REGRESSION; ROTATING ANALYZER ELLIPSOMETRIES; SPECTROSCOPIC ELLIPSOMETERS; TEMPERATURE VARIATION;

COMPUTER PROGRAMMING LANGUAGES; ELLIPSOMETRY; MAGNETIC PERMEABILITY; MATRIX ALGEBRA; POLARIZATION; SINGLE CRYSTALS; SYNCHROTRON RADIATION;

SPECTROMETERS;

EID: 84874926993     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4789495     Document Type: Conference Paper

References (90)

1. W. S. Weiglhofer and A. Lakhtakia, Introduction to Complex Mediums for Optics and Electromagnetics (SPIE Optical Engineering, Bellingham, Washington, 2003).
2. P. D. Rogers, T. D. Kang, T. Zhou, M. Kotelyanskii, and A. A. Sirenko, Thin Solid Films 519, 2668 (2011). 10.1016/j.tsf.2010.12.066
3. T. D. Kang, E. Standard, G. L. Carr, T. Zhou, M. Kotelyanskii, and A. A. Sirenko, Thin Solid Films 519, 2698 (2011). 10.1016/j.tsf.2010.12.057
4. P. D. Rogers, Y. J. Choi, E. C. Standard, T. D. Kang, K. H. Ahn, A. Dubroka, P. Marsik, Ch. Wang, C. Bernhard, S. Park, S.-W. Cheong, M. Kotelyanskii, and A. A. Sirenko, Phys. Rev. B 83, 174407 (2011). 10.1103/PhysRevB.83.174407
5. T. N. Stanislavchuk, A. A. Sirenko, A. P. Litvinchuk, X. Luo, and S.-W. Cheong, J. Appl. Phys. 112, 044108 (2012). 10.1063/1.4748309
6. D. W. Jeong, W. S. Choi, T. D. Kang, C. H. Sohn, A. David, H. Rotella, A. A. Sirenko, C. H. Lee, J. H. Kim, U. Lüders, W. Prellier, Y.-J. Kim, Y. S. Lee, and T. W. Noh, Phys. Rev. B 84, 115132 (2011). 10.1103/PhysRevB.84.115132
7. J. Kircher, R. Henn, M. Cardona, P. L. Richards, and G. P. Williams, J. Opt. Soc. Am. B 14, 705 (1997). 10.1364/JOSAB.14.000705
8. R. Henn, C. Bernhard, A. Wittlin, M. Cardona, and S. Uchida, Thin Solid Films 313-314, 642 (1998). 10.1016/S0040-6090(97)00970-X
9. C. Bernhard, R. Henn, A. Wittlin, M. Kläser, G. Müller-Vogt, C. T. Lin, and M. Cardona, Phys. Rev. Lett. 80, 1762 (1998). 10.1103/PhysRevLett. 80.1762
10. A. A. Sirenko, C. Bernhard, A. Golnik, A. M. Clark, J. Hao, W. Si, and X. X. Xi, Nature (London) 404, 373 (2000). 10.1038/35006023
11. C. Bernhard, D. Munzar, A. Wittlin, W. König, A. Golnik, C. T. Lin, M. Kläser, Th. Wolf, G. Müller-Vogt, and M. Cardona, Phys. Rev. B 59, R6631 (1999). 10.1103/PhysRevB.59.R6631
12. C. Bernhard, T. Holden, J. Humlicek, D. Munzar, M. Cardona, and B. Keimer, Solid State Commun. 121, 93 (2002). 10.1016/S0038-1098(01)00451-3
13. A. V. Pimenov, A. V. Boris, Li Yu, V. Hinkov, Th. Wolf, B. Keimer, and C. Bernhard, Phys. Rev. Lett. 94, 227003 (2005). 10.1103/PhysRevLett.94.227003
14. C. Bernhard, A. V. Boris, N. N. Kovaleva, G. Khaliullin, A. Pimenov, D. P. Chen, C. T. Lin, and B. Keimer, Phys. Rev. Lett. 93, 167003 (2004). 10.1103/PhysRevLett.93.167003
15. N. N. Kovaleva, A. V. Boris, C. Bernhard, A. Kulakov, A. Pimenov, A. M. Balbashov, G. Khaliullin, and B. Keimer, Phys. Rev. Lett. 93, 147204 (2004). 10.1103/PhysRevLett.93.147204
16. A. V. Boris, N. N. Kovaleva, T. Holden, O. V. Dolgov, C. T. Lin, B. Keimer, and C. Bernhard, Science 304, 708 (2004). 10.1126/science.1095532
17. A. V. Boris, Y. Matiks, E. Benckiser, A. Frano, P. Popovich, V. Hinkov, P. Wochner, M. Castro-Colin, E. Detemple, V. K. Malik, C. Bernhard, T. Prokscha, A. Suter, Z. Salman, E. Morenzoni, G. Cristiani, H.-U. Habermeier, and B. Keimer, Science 332, 937 (2011). 10.1126/science.1202647
18. S. S. A. Seo, W. S. Choi, H. N. Lee, L. Yu, K. W. Kim, C. Bernhard, and T. W. Noh, Phys. Rev. Lett. 99, 266801 (2007). 10.1103/PhysRevLett.99.266801
19. A. Dubroka, M. Rössle, K. W. Kim, V. K. Malik, L. Schulz, S. Thiel, C. W. Schneider, J. Mannhart, G. Herranz, O. Copie, M. Bibes, A. Barthélémy and C. Bernhard, Phys. Rev. Lett. 104, 156807 (2010). 10.1103/PhysRevLett.104.156807
20. Li Yu, D. Munzar, A. V. Boris, P. Yordanov, J. Chaloupka, Th. Wolf, C. T. Lin, B. Keimer, and C. Bernhard, Phys. Rev. Lett. 100, 177004 (2008). 10.1103/PhysRevLett.100.177004
21. A. Charnukha, P. Popovich, Y. Matiks, D. L. Sun, C. T. Lin, A. N. Yaresko, B. Keimer, and A. V. Boris, Nat. Commun. 2, 219 (2011). 10.1038/ncomms1223
22. C. Bernhard, J. Humlicek, and B. Keimer, Thin Solid Films 455-456, 143 (2004). 10.1016/j.tsf.2004.01.002
23. A. Röseler, U. Schade, and K. Hoildack, in the Proceedings of the joint 30th International Conference on Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics, Williamsburg, VA, 2005, edited by, K. J. Button, and, G. R. Neil, (IEEE, Piscataway, NJ, 2005), Vol. 1, p. 190.
24. W. J. Padilla, Z. Q. Li, K. S. Burch, Y. S. Lee, K. J. Mikolaitis, and D. N. Basov, Rev. Sci. Instrum. 75, 4710 (2004). 10.1063/1.1805252
25. D. T. Chuss, S. H. Moseley, G. Novak, and E. J. Wollack, Proc. SPIE 5492, 1487 (2004). 10.1117/12.552103
26. T. Hofmann, U. Schade, W. Eberhardt, C. M. Herzinger, P. Esquinazi, and M. Schubert, Rev. Sci. Instrum. 77, 063902 (2006). 10.1063/1.2209968
27. C. J. Hirschmugl and G. P. Williams, " Infrared synchrotron radiation: Programs at the NSLS.," Synchrotron Radiat. News 8, 10 (1995). 10.1080/08940889508602835
28. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977).
29. A. DeMartino, E. Garcia-Caurel, B. Laude, and B. Drevillon, Thin Solid Films 455-456, 112 (2004). 10.1016/j.tsf.2003.12.052
30. A. Ambirajan and D. C. Look, Opt. Eng. 34, 1651 (1995). 10.1117/12.202093
31. A. Ambirajan and D. C. Look, Opt. Eng. 34, 1656 (1995). 10.1117/12.202098
32. D. S. Sabatke, M. R. Decour, E. L. Dereniak, W. C. Sweatt, S. A. Kemme, and G. S. Phipps, Opt. Lett. 25, 802 (2000). 10.1364/OL.25.000802
33. D. E. Aspnes, in Handbook of Optical Constants of Solids, edited by, E. D. Palik, (Academic, New York, 1985), p. 89.
34. M. Schubert, in Handbook of Ellipsometry, edited by, G. Irene, and, H. Tompkins, (William Andrew, Norwich, NY, 2005), p. 637.
35. G. E. Jellison Jr., Thin Solid Films 313-314, 33 (1998). 10.1016/S0040-6090(97)00765-7
36. U. Rossow and W. Richter, in Optical Characterization of Epitaxial Semiconductor Layers, edited by, G. Bauer, and, W. Richter, (Springer, New York, 1996), p. 68.
37. H. Fujiwara, Spectroscopic Ellipsometry: Principles and Applications (Wiley, 2007).
38. T. Hofmann, U. Schade, C. M. Herzinger, P. Esquinazi, and M. Schubert, Proc. SPIE 6120, 61200D (2006). 10.1117/12.660382
39. T. Hofmann, C. M. Herzinger, A. Boosalis, T. E. Tiwald, J. A. Woollam, and M. Schubert, Rev. Sci. Instrum. 81, 023101 (2010). 10.1063/1.3297902
40. A. Röseler, Infrared Spectroscopic Ellipsometry (Akademie, Berlin, 1992).
41. R. M. A. Azzam, Handbook of Optics, edited by, M. Bass, (McGraw-Hill, New York, 1995), Vol. II, Chap. 27.
42. M. Schubert, B. Rheinländer, B. Johs, C. M. Herzinger, and J. A. Woollam, J. Opt. Soc. Am. A 13, 875 (1996). 10.1364/JOSAA.13.000875
43. M. Schubert, T. E. Tiwald, and J. A. Woollam, Appl. Opt. 38, 177 (1999). 10.1364/AO.38.000177
44. M. Schubert, Phys. Rev. B 53, 4265 (1996). 10.1103/PhysRevB.53.4265
45. T. E. Tiwald and M. Schubert, Proc. SPIE 4103, 19 (2000). 10.1117/12.403587
46. M. Schubert, " Another century of ellipsometry.," Ann. Phys. 15, 480-497 (2006). 10.1002/andp.200510204
47. M. Schubert, A. Kasic, T. Hofmann, V. Gottschalch, J. Off, F. Scholz, E. Schubert, H. Neumann, I. Hodgkinson, M. Arnold, W. Dollase, and C. M. Herzinger, " Generalized ellipsometry of complex mediums in layered systems.," Proc. SPIE 4806, 264 (2002). 10.1117/12.472993
48. M. Schubert, T. Hofmann, and C. M. Herzinger, J. Opt. Soc. Am. A 20 (2), 347 (2003). 10.1364/JOSAA.20.000347
49. I. V. Lindell, A. H. Sihvola, S. A. Tretyakov and A. J. Viitanen, Electromagnetic Waves in Chiral and Bi-Isotropic Media (Artech House, Boston, 1994).
50. J. F. Nye, Physical Properties of Crystals-Their Representation by Tensors and Matrices (Oxford University Press, Oxford, 2006).
51. I. E. Dzyaloshinskii, Sov. Phys. JETP 10, 628 (1959).
52. A. Cano, Phys. Rev. B 80 (18), 180416 (2009). 10.1103/PhysRevB.80.180416
53. T. H. O'Dell, The Electrodynamics of Magneto-Electric Media (North-Holland, Amsterdam, 1970).
54. J.-P. Rivera, Eur. Phys. J. B 71 (3), 299 (2009). 10.1140/epjb/e2009- 00336-7
55. P. D. Rogers, M. Kotelyanskii, and A. A. Sirenko, e-print arXiv:1105.4934 [physics.optics].
56. E. Georgieva, J. Opt. Soc. Am. A 12, 2203 (1995). 10.1364/JOSAA.12.002203
57. O. Arteaga, Opt. Lett. 35, 1359 (2010). 10.1364/OL.35.001359
58. E. Bahar, J. Opt. Soc. Am. B 26, 364 (2009). 10.1364/JOSAB.26.000364
59. E. M. Georgieva, I. J. Lalov, and M. Gospodinov, Optik (Jena) 109, 173-176 (1998).
60. D. W. Berreman, J. Opt. Soc. Am. 62, 502 (1972). 10.1364/JOSA.62.000502
61. Q. Cheng and T. J. Cui, J. Opt. Soc. Am. A 23, 3203 (2006). 10.1364/JOSAA.23.003203
62. D. B. Litvin, " Property tensor invariant under magnetic point group.," private communication, Penn State University, 2011.
63. F. Sayetat, J. Magn. Magn. Mater. 58, 334 (1986). 10.1016/0304-8853(86) 90456-7
64. F. Sayetat, J. X. Boucherle, and F. Tcheou, J. Magn. Magn. Mater. 46, 219 (1984). 10.1016/0304-8853(84)90360-3
65. R. Hock, H. Fuess, T. Vogt, and M. Bonnet, J. Solid State Chem. 84, 39 (1990). 10.1016/0022-4596(90)90182-W
66. D. Louca, K. Kamazawa, and T. Proffen, Phys. Rev. B 80, 214406 (2009). 10.1103/PhysRevB.80.214406
67. A. J. Sievers and M. Tinkham, Phys. Rev. 129, 1995 (1963). 10.1103/PhysRev.129.1995
68. M. Tinkham, Phys. Rev. 124, 311 (1961). 10.1103/PhysRev.124.311
69. J. Yamamoto, B. T. Smith, and E. E. Bell, J. Opt. Soc. Am. 64, 880 (1974). 10.1364/JOSA.64.000880
70. T. D. Kang, E. C. Standard, P. D. Rogers, K. H. Ahn, A. A. Sirenko, A. Dubroka, C. Bernhard, S. Park, Y. J. Choi, and S.-W. Cheong, Phys. Rev. B 86, 144112 (2012). 10.1103/PhysRevB.86.144112
71. A. Pimenov, A. A. Mukhin, V. Yu. Ivanov, V. D. Travkin, A. M. Balbashov, and A. Loidl, Nat. Phys. 2, 97 (2006). 10.1038/nphys212
72. A. Pimenov, A. M. Shuvaev, A. A. Mukhin, and A. Loidl, J. Phys.: Condens. Matter 20, 434209 (2008). 10.1088/0953-8984/20/43/434209
73. D. Senff, N. Aliouane, D. N. Argyriou, A. Hiess, L. P. Regnault, P. Link, K. Hradil, Y. Sidis, and M. Braden, J. Phys.: Condens. Matter 20, 434212 (2008). 10.1088/0953-8984/20/43/434212
74. N. Kida, Y. Takahashi, J. S. Lee, R. Shimano, Y. Yamasaki, Y. Kaneko, S. Miyahara, N. Furukawa, T. Arima, and Y. Tokura, J. Opt. Soc. Am. B 26, A35 (2009). 10.1364/JOSAB.26.000A35
75. A. Pimenov, A. Shuvaev, A. Loidl, F. Schrettle, A. A. Mukhin, V. D. Travkin, V. Yu. Ivanov, and A. M. Balbashov, Phys. Rev. Lett. 102, 107203 (2009). 10.1103/PhysRevLett.102.107203
76. A. M. Shuvaev, V. D. Travkin, V. Yu. Ivanov, A. A. Mukhin, and A. Pimenov, Phys. Rev. Lett. 104, 097202 (2010). 10.1103/PhysRevLett.104.097202
77. A. B. Sushkov, R. Valdés Aguilar, S. Park, S-W. Cheong, and H. D. Drew, Phys. Rev. Lett. 98, 027202 (2007). 10.1103/PhysRevLett.98.027202
78. S. Pailhès, X. Fabrèges, L. P. Régnault, L. Pinsard-Godart, I. Mirebeasu, F. Moussa, M. Hennion, and S. Petit, Phys. Rev. B 79, 134409 (2009). 10.1103/PhysRevB.79.134409
79. M. Cazayous, Y. Gallais, A. Sacuto, R. de Sousa, D. Lebeugle, and D. Colson, Phys. Rev. Lett. 101, 037601 (2008). 10.1103/PhysRevLett.101.037601
80. P. Rovillain, R. de Sousa, Y. Gallais, A. Sacuto, M. A. Méasson, D. Colson, A. Forget, M. Bibes, A. Barthélémy, and M. Cazayous, Nature Mater. 9, 975 (2010). 10.1038/nmat2899
81. N. Kida, D. Okuyama, S. Ishiwata, Y. Taguchi, R. Shimano, K. Iwasa, T. Arima, and Y. Tokura, Phys. Rev. B 80, 220406(R) (2009). 10.1103/PhysRevB.80. 220406
82. N. Kida, S. Kumakura, S. Ishiwata, Y. Taguchi, and Y. Tokura, Phys. Rev. B 83, 064422 (2011). 10.1103/PhysRevB.83.064422
83. S. Seki, N. Kida, S. Kumakura, R. Shimano, and Y. Tokura, Phys. Rev. Lett. 105, 097207 (2010). 10.1103/PhysRevLett.105.097207
84. I. Kézsmárki, N. Kida, H. Murakawa, S. Bordács, Y. Onose, and Y. Tokura, Phys. Rev. Lett. 106, 057403 (2011). 10.1103/PhysRevLett. 106.057403
85. A. Shuvaev, F. Mayr, A. Loidl, A. A. Mukhin, and A. Pimenov, Eur. Phys. J. B 80, 351 (2011). 10.1140/epjb/e2011-10691-3
86. R. Schleck, R. L. Moreira, H. Sakata, and R. P. S. M. Lobo, Phys. Rev. B 82, 144309 (2010). 10.1103/PhysRevB.82.144309
87. T. Kimura, T. Goto, H. Shintani, K. Ishizaka, T. Arima, and Y. Tokura, Nature (London) 426, 55 (2003). 10.1038/nature02018
88. N. Matsumoto, T. Fujii, K. Kageyama, H. Takagi, T. Nagashima, and M. Hangyo, Jpn. J. Appl. Phys. 48, 09KC11 (2009). 10.1143/JJAP.48.09KC11
89. N. Matsumoto, T. Hosokura, T. Nagashima, and M. Hangyo, Opt. Lett. 36, 265 (2011). 10.1364/OL.36.000265
90. M. Neshat and N. P. Armitage, Opt. Express 20, 29063 (2012). 10.1364/OE.20.029063