Spectral THz ellipsometer for the unambiguous determination of all Stokes parameters

The Joint 30th International Conference on Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics, 2005. IRMMW-THz 2005

Volumn 1, Issue , 2005, Pages 190-191

  Roseler A ^a   Schade, U ^b   Holldack, K ^b  

^a Gesellschaft zur Forderung angewandter Optik GOS   (Germany)

^b HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETERS; MAGNETS; PHASE SHIFT; SYNCHROTRON RADIATION;

BENDING MAGNETS; RADIATION SOURCES; RETARDERS; STOKES PARAMETERS;

ELLIPSOMETRY;

EID: 33846465829     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. Bernhard, C., et al., Thin Solid Films 455-456 (2004), 143.
2. Singley, E.J., et al., Phys. Rev. B. 69 (2004), 092512.
3. Abo-Bakr, M., et al., Phys. Rev. Lett. 90 (2003), 094801.
4. A. Röseler, A., Infrared Spectroscopic Ellipsometry, Akademie Verlag, Berlin, 1990.
5. Schade, U., et al., Rev. Sci. Instrum. 73 (2002), 1568.