Variable-wavelength frequency-domain terahertz ellipsometry

Review of Scientific Instruments

Volumn 81, Issue 2, 2010, Pages

  Hofmann, T ^a   Herzinger, C M ^b   Boosalis, A ^a   Tiwald, T E ^b   Woollam, J A ^b   Schubert, M ^a  

^a UNIVERSITY OF NEBRASKA LINCOLN   (United States)

^b J A WOOLLAM CO INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLES OF INCIDENCE; BACKWARD WAVE OSCILLATOR; BASE FREQUENCIES; CLASSICAL DRUDE MODEL; ELECTRON CONCENTRATION; ELLIPSOMETERS; ELLIPSOMETRIC DATA; ELLIPSOMETRIC MEASUREMENTS; EXPERIMENTAL SETUP; FREE CHARGE; FREQUENCY DOMAINS; FREQUENCY MULTIPLIER; IMAGE ROTATION; INPUT POLARIZATION; MIDINFRARED; MODEL SYSTEM; ROTATING ANALYZERS; SCHOTTKY DIODES; SI SUBSTRATES; SPECTRAL RANGE; TERA HERTZ; TERAHERTZ SPECTRAL RANGE; WAVELENGTH TUNABLE; WIRE GRID POLARIZERS;

ELLIPSOMETRY; FREQUENCY DOMAIN ANALYSIS; OPTICAL INSTRUMENTS; PHOSPHORUS; RECTANGULAR WAVEGUIDES; ROTATION; SCHOTTKY BARRIER DIODES;

TERAHERTZ WAVES;

EID: 77949304130     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3297902     Document Type: Conference Paper

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