Terahertz generalized Mueller-matrix ellipsometry

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6120, Issue , 2006, Pages

  Hofmann, T ^a   Schade, U ^b   Herzinger, C M ^c   Esquinazi, P ^d   Schubert, M ^a  

^a UNIVERSITY OF NEBRASKA LINCOLN   (United States)

^b HAHN MEITNER INSTITUT   (Germany)

^c J A WOOLLAM CO INC   (United States)

^d UNIVERSITY OF LEIPZIG   (Germany)

Author keywords

Far infrared; Free charge carrier response; Generalized Mueller matrix ellipsometry; Magnetooptic anisotropy; THz

Indexed keywords

FAR INFRARED; FREE-CHARGE-CARRIER RESPONSE; GENERALIZED MUELLER-MATRIX ELLIPSOMETRY; MAGNETOOPTIC ANISOTROPY; THZ;

CHARGE CARRIERS; MAGNETIC ANISOTROPY; MAGNETIC FIELDS; SUPERCONDUCTING DEVICES; SYNCHROTRON RADIATION;

ELLIPSOMETRY;

EID: 33646759926     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.660382     Document Type: Conference Paper

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