Novel ultra-low power RRAM with good endurance and retention

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 2010, Pages 85-86

  Cheng, C H ^a,b   Chin, Albert ^b   Yeh, F S ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CYCLING ENDURANCE; LOW COSTS; NS SWITCHING; ULTRA-LOW POWER;

DURABILITY;

EID: 77957863654     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VLSIT.2010.5556180     Document Type: Conference Paper

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