Chemical speciation at buried interfaces in high-temperature processed polycrystalline silicon thin-film solar cells on ZnO:Al

Journal of Applied Physics

Volumn 113, Issue 4, 2013, Pages

  Becker, Christiane ^a   Pagels, Marcel ^b   Zachäus, Carolin ^a   Pollakowski, Beatrix ^c   Beckhoff, Burkhard ^c   Kanngießer, Birgit ^b   Rech, Bernd ^a  

^a HAHN MEITNER INSTITUT   (Germany)

^b TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

^c PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

A-ZNO; ABSORBER MATERIAL; ALUMINIUM OXIDE; ALUMINUM DOPED ZINC OXIDE LAYERS; ANNEALING PROCEDURES; BURIED INTERFACE; CHEMICAL INTERFACES; COATED GLASS; ELECTRICAL MATERIALS; ELEMENTAL COMPOSITIONS; GRAZING INCIDENCE; HIGH MOBILITY; HIGH TEMPERATURE; HIGH-TEMPERATURE TREATMENT; IN-DEPTH KNOWLEDGE; INTERFACE REACTIONS; LOW COSTS; PHOTOVOLTAICS; POLYCRYSTALLINE; POLYCRYSTALLINE SILICON (POLY-SI); RAPID THERMAL TREATMENT; SILICON NITRIDE (SIN); SILICON THIN-FILM SOLAR CELLS; SOLAR CELL PERFORMANCE; SOLID-PHASE-CRYSTALLIZED; THERMAL ANNEALS; THIN FILM MATERIAL; THIN-FILM SOLAR CELLS; TRANSPARENT CONDUCTIVE OXIDES; X RAY FLUORESCENCE SPECTROMETRY; ZINC SILICATE; ZNO FILMS; ZNO:AL;

ALUMINUM; CHEMICAL ANALYSIS; CHEMICAL COMPOUNDS; CHEMICAL MODIFICATION; CHEMICAL SPECIATION; FLUORESCENCE SPECTROSCOPY; HEAT TREATMENT; INTERFACES (MATERIALS); NANOSTRUCTURED MATERIALS; OPEN CIRCUIT VOLTAGE; OPTICAL FILMS; OPTOELECTRONIC DEVICES; POLYSILICON; SILICATES; SILICON NITRIDE; SILICON OXIDES; SILICON SOLAR CELLS; ZINC; ZINC OXIDE;

ALUMINUM COATINGS;

EID: 84873670822     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4789599     Document Type: Article

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