Frictional behavior of Ag nanodot-pattern fabricated by thermal dewetting

Surface and Coatings Technology

Volumn 215, Issue , 2013, Pages 234-240

  Kim, Hyun Joon ^a   Kim, Dae Eun ^a  

^a Yonsei University   (South Korea)

Author keywords

Ag nanodot pattern; Atomic force microscopy; Friction; Hertzian contact analysis; Thermal dewetting

Indexed keywords

AFM; AG FILMS; ANNEALING TEMPERATURES; ATOMIC FORCE MICROSCOPE (AFM); CONTACT ANALYSIS; CONTACT AREAS; FABRICATE PATTERNS; FRICTION COEFFICIENTS; FRICTION TEST; FRICTIONAL BEHAVIOR; FRICTIONAL FORCES; HERTZIAN CONTACT ANALYSIS; NANO PATTERN; REAL CONTACT AREA; RF-SPUTTERING; SILICON SUBSTRATES; STEADY STATE; THERMAL DEWETTING;

ATOMIC FORCE MICROSCOPY; FABRICATION; FRICTION; NANOSTRUCTURED MATERIALS; SILICON; SILICON WAFERS; THIN FILMS; TRIBOLOGY;

SILVER;

EID: 84872680258     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2012.05.146     Document Type: Article

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