Corrected direct force balance method for atomic force microscopy lateral force calibration

Review of Scientific Instruments

Volumn 80, Issue 6, 2009, Pages

  Asay, David B ^a   Hsiao, Erik ^a   Kim, Seong H ^a  

^a The Pennsylvania State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED LOADS; FORCE BALANCES; FORCE-DISTANCE CURVES; IN-CONTROL; LATERAL CALIBRATION; LATERAL FORCE; LATERAL FORCE CALIBRATION; POINT OF CONTACT; SLOPED SURFACES; SUBSTRATE CONTACT;

ATOMIC FORCE MICROSCOPY; ATOMS; ELECTRIC MACHINERY;

CALIBRATION;

EID: 67650330605     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3142243     Document Type: Article

References (15)

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15. See EPAPS Document No, E-RSINAK-80-004906 for (a) force balances for complete-slip and no-slip cases, (b) asymmetry of the f-d lateral signals due to friction, (c) detector cross-talk effects, (d) comparison with the negligible friction case, (e) error estimation for ignoring tip slip in Δz, and (f) verification of the force balance using a macroscale model cantilever. For more information on EPAPS, see http://www.aip.org/pubservs/epaps.html.