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Volumn 24, Issue 1, 2013, Pages

Atomic force microscopy based manipulation of graphene using dynamic plowing lithography

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AFM PROBE; AFM TIP; APPLIED FORCES; CONDUCTIVE AFM; ELECTRICAL CHARACTERIZATION; GRAPHENE SHEETS; KELVIN PROBE FORCE MICROSCOPY; LOCAL STRAINS; SILICONDIOXIDE SUBSTRATES; TAPPING-MODE ATOMIC FORCE MICROSCOPY;

EID: 84870518722     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/24/1/015303     Document Type: Article
Times cited : (63)

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