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Volumn 21, Issue 48, 2009, Pages

Atomic force microscope nanolithography: dip-pen, nanoshaving, nanografting, tapping mode, electrochemical and thermal nanolithography

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AFM NANOLITHOGRAPHY; AFM PROBE; AFM TIP; ATOMIC FORCE MICROSCOPES; DIP-PEN NANOLITHOGRAPHY; FABRICATION PROCESS; MECHANICAL FORCE; NANOGRAFTING; NANOSHAVING; STATE OF RESEARCH; STATE OF THE ART; TAPPING MODES;

EID: 77956020940     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/21/48/483001     Document Type: Review
Times cited : (80)

References (133)
  • 2
    • 2442712488 scopus 로고    scopus 로고
    • Scanning probe microscopies beyond imaging
    • Samori P 2004 Scanning probe microscopies beyond imaging J. Mater. Chem. 14 1353-66
    • (2004) J. Mater. Chem. , vol.14 , pp. 1353-66
    • Samori, P.1
  • 129
    • 77956035363 scopus 로고
    • Chemical Bonds and Bond Energy 2nd edn (New York: Academic) ISBN-10: 0126180601
    • Sanderson R T 1976 Chemical Bonds and Bond Energy 2nd edn (New York: Academic) ISBN-10:0126180601
    • (1976)
    • Sanderson, R.T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.