Atomic force microscopy based tunable local anodic oxidation of graphene

Nano Letters

Volumn 11, Issue 11, 2011, Pages 4542-4546

  Masubuchi, Satoru ^a,b   Arai, Miho ^a   MacHida, Tomoki ^a,b,c  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AFM CANTILEVERS; LOCAL ANODIC OXIDATION; OXIDATION LEVEL; SEMI-INSULATING; TUNABILITIES;

ATOMIC FORCE MICROSCOPY; GRAPHENE;

ANODIC OXIDATION;

GRAPHITE; NANOMATERIAL;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; ELECTRODE; ELECTROPLATING INDUSTRY; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; OXIDATION REDUCTION REACTION; PARTICLE SIZE; SURFACE PROPERTY; SYNTHESIS; ULTRASTRUCTURE;

CRYSTALLIZATION; ELECTRODES; ELECTROPLATING; GRAPHITE; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MICROSCOPY, ATOMIC FORCE; MOLECULAR CONFORMATION; NANOSTRUCTURES; OXIDATION-REDUCTION; PARTICLE SIZE; SURFACE PROPERTIES;

EID: 80755161429     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl201448q     Document Type: Article

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