|
Volumn 22, Issue 45, 2012, Pages 23935-23943
|
Charge trapping behavior in organic-inorganic alloy films grown by molecular layer deposition from trimethylaluminum, p-phenylenediamine and water
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ALLOY FILM;
CHARGE TRAPPING MEMORIES;
GROWTH MECHANISMS;
HYBRID FILM;
HYBRID LAYER;
MOLECULAR LAYER DEPOSITION;
ORGANIC MOIETY;
ORGANIC-INORGANIC;
ORGANIC-INORGANIC HYBRID;
ORGANIC-INORGANIC HYBRID FILMS;
P-PHENYLENE DIAMINES;
STABILITY PROBLEM;
STRUCTURAL FLEXIBILITIES;
SUB-CYCLE;
SUBCYCLES;
TRAPPING ABILITY;
TRIMETHYLALUMINUM;
ATOMIC LAYER DEPOSITION;
CHARGE TRAPPING;
DIELECTRIC PROPERTIES;
FUNCTIONAL MATERIALS;
LEAKAGE CURRENTS;
METALLIC FILMS;
|
EID: 84868159726
PISSN: 09599428
EISSN: 13645501
Source Type: Journal
DOI: 10.1039/c2jm35553a Document Type: Article |
Times cited : (22)
|
References (56)
|