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Volumn 22, Issue 45, 2012, Pages 23935-23943

Charge trapping behavior in organic-inorganic alloy films grown by molecular layer deposition from trimethylaluminum, p-phenylenediamine and water

Author keywords

[No Author keywords available]

Indexed keywords

ALLOY FILM; CHARGE TRAPPING MEMORIES; GROWTH MECHANISMS; HYBRID FILM; HYBRID LAYER; MOLECULAR LAYER DEPOSITION; ORGANIC MOIETY; ORGANIC-INORGANIC; ORGANIC-INORGANIC HYBRID; ORGANIC-INORGANIC HYBRID FILMS; P-PHENYLENE DIAMINES; STABILITY PROBLEM; STRUCTURAL FLEXIBILITIES; SUB-CYCLE; SUBCYCLES; TRAPPING ABILITY; TRIMETHYLALUMINUM;

EID: 84868159726     PISSN: 09599428     EISSN: 13645501     Source Type: Journal    
DOI: 10.1039/c2jm35553a     Document Type: Article
Times cited : (22)

References (56)
  • 47
    • 0004005306 scopus 로고    scopus 로고
    • John Wiley and Sons, New Jersey, 3rd edn
    • S. M. Sze, Physics of Semiconductor Devices, John Wiley and Sons, New Jersey, 3rd edn, 2007, p. 197
    • (2007) Physics of Semiconductor Devices , pp. 197
    • Sze, S.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.