Observation of negative charge trapping and investigation of its physicochemical origin in newly synthesized poly(tetraphenyl)silole siloxane thin films

Journal of the American Chemical Society

Volumn 133, Issue 20, 2011, Pages 7764-7785

  Choi, Jin Kyu ^a   Jang, Seunghyun ^b   Kim, Ki Jeong ^c   Sohn, Honglae ^b   Jeong, Hyun Dam ^a  

^a Chonnam National University   (South Korea)

^b Chosun University   (South Korea)

^c Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE VOLTAGE MEASUREMENTS; CHARGE TRAP; CURING TEMPERATURE; DECAY CONSTANTS; DEVICE STRUCTURES; DIELECTRIC THIN FILMS; ELECTRON TRANSFER; ELECTRON TRANSPORT; ELECTRON TRAPPING; FERMI ENERGY LEVELS; FLATBAND SHIFT; HIGH REFRACTIVE INDEX; KINETICS MODELS; LUMO ENERGY LEVELS; METAL INSULATORS; NEAR EDGE X-RAY ABSORPTION FINE STRUCTURE SPECTROSCOPIES; NEGATIVE CHARGE; ORGANIC-INORGANIC HYBRID POLYMER; PHENYL GROUP; PHOTOEMISSION SPECTROSCOPY; POLYMER CHAINS; POLYMER DESIGNS; POLYSILOLE; TRAP DENSITY;

ABSORPTION SPECTROSCOPY; CHARGE TRAPPING; CURING; DIELECTRIC MATERIALS; ELECTRON AFFINITY; ELECTRON TRANSITIONS; ELECTRON TRANSPORT PROPERTIES; EMISSION SPECTROSCOPY; FILM THICKNESS; METAL INSULATOR BOUNDARIES; MIS DEVICES; O RINGS; ORGANIC POLYMERS; REFRACTIVE INDEX; SPECTROSCOPIC ELLIPSOMETRY; THIN FILMS; VANADIUM; X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY;

POLYMER FILMS;

ORGANOSILICON DERIVATIVE; OXYGEN; PHENYL GROUP; POLY(TETRAPHENYL)SILOLE SILOXANE; POLYMER; SILICONE; UNCLASSIFIED DRUG;

ARTICLE; BINDING AFFINITY; CONTROLLED STUDY; CROSS LINKING; DENSITY GRADIENT; DIELECTRIC CONSTANT; ELECTRIC CAPACITANCE; ELECTRIC POTENTIAL; ELECTRICITY; ELECTRON; ELECTRON TRANSPORT; ELLIPSOMETRY; ENERGY; FILM; KINETICS; METAL INSULATOR SEMICONDUCTOR; MOLECULAR INTERACTION; NANOFABRICATION; NEAR EDGE X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; NEGATIVE CHARGE TRAPPING; PHOTOEMISSION SPECTROSCOPY; PHYSICAL CHEMISTRY; POLARIZATION; POLYMERIZATION; RING OPENING; ROOM TEMPERATURE; SEMICONDUCTOR; SPECTROSCOPIC ELLIPSOMETRY; SPECTROSCOPY; SYNTHESIS; THERMODYNAMICS; THICKNESS; X RAY ABSORPTION SPECTROSCOPY;

EID: 79957751489     PISSN: 00027863     EISSN: 15205126     Source Type: Journal    
DOI: 10.1021/ja1108112     Document Type: Article

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