메뉴 건너뛰기




Volumn 86, Issue 13, 2012, Pages

Origin of piezoelectric response under a biased scanning probe microscopy tip across a 180 ∞ ferroelectric domain wall

Author keywords

[No Author keywords available]

Indexed keywords


EID: 84867771670     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.86.134115     Document Type: Article
Times cited : (30)

References (62)
  • 2
    • 0001611660 scopus 로고    scopus 로고
    • Self-patterning nano-electrodes on ferroelectric thin films for gigabit memory applications
    • DOI 10.1063/1.122214, PII S000369519800237X
    • M. Alexe, J. Scott, C. Curran, N. Zakharov, D. Hesse, and A. Pignolet, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.122214 73, 1592 (1998). (Pubitemid 128671924)
    • (1998) Applied Physics Letters , vol.73 , Issue.11 , pp. 1592-1594
    • Alexe, M.1    Scott, J.F.2    Curran, C.3    Zakharov, N.D.4    Hesse, D.5    Pignolet, A.6
  • 3
    • 40849124215 scopus 로고    scopus 로고
    • Piezoresponse force microscopy studies of switching behavior of ferroelectric capacitors on a 100-ns time scale
    • DOI 10.1103/PhysRevLett.100.097601
    • A. Gruverman, D. Wu, and J. Scott, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.100.097601 100, 097601 (2008). (Pubitemid 351399093)
    • (2008) Physical Review Letters , vol.100 , Issue.9 , pp. 097601
    • Gruverman, A.1    Wu, D.2    Scott, J.F.3
  • 5
    • 34748907136 scopus 로고    scopus 로고
    • Spatially resolved mapping of ferroelectric switching behavior in self-assembled multiferroic nanostructures: Strain, size, and interface effects
    • DOI 10.1088/0957-4484/18/40/405701, PII S0957448407523317
    • B. J. Rodriguez, S. Jesse, A. P. Baddorf, T. Zhao, Y. Chu, R. Ramesh, E. A. Eliseev, A. N. Morozovska, and S. V. Kalinin, Nanotechnology NNOTER 0957-4484 10.1088/0957-4484/18/40/405701 18, 405701 (2007). (Pubitemid 47479670)
    • (2007) Nanotechnology , vol.18 , Issue.40 , pp. 405701
    • Rodriguez, B.J.1    Jesse, S.2    Baddorf, A.P.3    Zhao, T.4    Chu, Y.H.5    Ramesh, R.6    Eliseev, E.A.7    Morozovska, A.N.8    Kalinin, S.V.9
  • 8
    • 26644453586 scopus 로고    scopus 로고
    • Domain populations in lead zirconate titanate thin films of different compositions via piezoresponse force microscopy
    • DOI 10.1088/0957-4484/16/11/020, PII S0957448405016272
    • A. Wu, P. Vilarinho, V. Shvartsman, G. Suchaneck, and A. Kholkin, Nanotechnology NNOTER 0957-4484 10.1088/0957-4484/16/11/020 16, 2587 (2005). (Pubitemid 41439677)
    • (2005) Nanotechnology , vol.16 , Issue.11 , pp. 2587-2595
    • Wu, A.1    Vilarinho, P.M.2    Shvartsman, V.V.3    Suchaneck, G.4    Kholkin, A.L.5
  • 10
    • 33746591766 scopus 로고    scopus 로고
    • Nanoscale ferroelectrics: Processing, characterization and future trends
    • DOI 10.1088/0034-4885/69/8/R04, PII S0034488506839928, R04
    • A. Gruverman and A. Kholkin, Rep. Prog. Phys. RPPHAG 0034-4885 10.1088/0034-4885/69/8/R04 69, 2443 (2006). (Pubitemid 44144177)
    • (2006) Reports on Progress in Physics , vol.69 , Issue.8 , pp. 2443-2474
    • Gruverman, A.1    Kholkin, A.2
  • 26
    • 33746851949 scopus 로고    scopus 로고
    • Quantitative mapping of switching behavior in piezoresponse force microscopy
    • DOI 10.1063/1.2214699
    • S. Jesse, H. N. Lee, and S. V. Kalinin, Rev. Sci. Instrum. 10.1063/1.2214699 77, 073702 (2006). (Pubitemid 44179750)
    • (2006) Review of Scientific Instruments , vol.77 , Issue.7 , pp. 073702
    • Jesse, S.1    Lee, H.N.2    Kalinin, S.V.3
  • 29
    • 33746591766 scopus 로고    scopus 로고
    • Nanoscale ferroelectrics: Processing, characterization and future trends
    • DOI 10.1088/0034-4885/69/8/R04, PII S0034488506839928, R04
    • A. Gruverman and A. Kholkin, Rep. Prog. Phys. RPPHAG 0034-4885 10.1088/0034-4885/69/8/R04 69, 2443 (2006). (Pubitemid 44144177)
    • (2006) Reports on Progress in Physics , vol.69 , Issue.8 , pp. 2443-2474
    • Gruverman, A.1    Kholkin, A.2
  • 35
    • 33745054326 scopus 로고    scopus 로고
    • Materials contrast in piezoresponse force microscopy
    • DOI 10.1063/1.2206992
    • S. V. Kalinin, E. A. Eliseev, and A. N. Morozovska, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.2206992 88, 232904 (2006). (Pubitemid 43877752)
    • (2006) Applied Physics Letters , vol.88 , Issue.23 , pp. 232904
    • Kalinin, S.V.1    Eliseev, E.A.2    Morozovska, A.N.3
  • 40
    • 77956335838 scopus 로고    scopus 로고
    • JAPIAU 0021-8979 10.1063/1.3474953
    • J. Guyonnet, H. Bea, and P. Paruch, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.3474953 108, 042002 (2010).
    • (2010) J. Appl. Phys. , vol.108 , pp. 042002
    • Guyonnet, J.1    Bea, H.2    Paruch, P.3
  • 42
    • 33746590809 scopus 로고    scopus 로고
    • Detection mechanism for ferroelectric domain boundaries with lateral force microscopy
    • DOI 10.1063/1.2234303
    • T. Jungk, Á. Hoffmann, and E. Soergel, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.2234303 89, 042901 (2006). (Pubitemid 44147579)
    • (2006) Applied Physics Letters , vol.89 , Issue.4 , pp. 042901
    • Jungk, T.1    Hoffmann, A.2    Soergel, E.3
  • 47
    • 0036535681 scopus 로고    scopus 로고
    • 3 relevant for electro- and elasto-optics
    • DOI 10.1007/s003400200818
    • M. Jazbinsek and M. Zgonik, Appl. Phys. B APBOEM 0946-2171 10.1007/s003400200818 74, 407 (2002). (Pubitemid 34306429)
    • (2002) Applied Physics B: Lasers and Optics , vol.74 , Issue.4-5 , pp. 407-414
    • Jazbinsek, M.1    Zgonik, M.2
  • 48
    • 84867804854 scopus 로고    scopus 로고
    • Ph.D. thesis, Pennsylvania State University, State College
    • L. Tian, Ph.D. thesis, Pennsylvania State University, State College, 2006.
    • (2006)
    • Tian, L.1
  • 52
    • 2342507053 scopus 로고    scopus 로고
    • Piezoelectric characterization individual zinc oxide nanobelt probed by piezoresponse force microscope
    • DOI 10.1021/nl035198a
    • M. H. Zhao, Z. L. Wang, and S. X. Mao, Nano Lett. NALEFD 1530-6984 10.1021/nl035198a 4, 587 (2004). (Pubitemid 38586618)
    • (2004) Nano Letters , vol.4 , Issue.4 , pp. 587-590
    • Zhao, M.-H.1    Wang, Z.-L.2    Mao, S.X.3
  • 53
    • 65549090438 scopus 로고    scopus 로고
    • NJOPFM 1367-2630 10.1088/1367-2630/11/3/033029
    • T. Jungk, A. Hoffmann, and E. Soergel, New J. Phys. NJOPFM 1367-2630 10.1088/1367-2630/11/3/033029 11, 033029 (2009).
    • (2009) New J. Phys. , vol.11 , pp. 033029
    • Jungk, T.1    Hoffmann, A.2    Soergel, E.3
  • 54
    • 80755187519 scopus 로고    scopus 로고
    • JPAPBE 0022-3727 10.1088/0022-3727/44/46/464003
    • E. Soergel, J. Phys. D: Appl. Phys. JPAPBE 0022-3727 10.1088/0022-3727/ 44/46/464003 44, 464003 (2011).
    • (2011) J. Phys. D: Appl. Phys. , vol.44 , pp. 464003
    • Soergel, E.1
  • 55
  • 59
    • 35348864362 scopus 로고    scopus 로고
    • The piezoresponse force microscopy of surface layers and thin films: Effective response and resolution function
    • DOI 10.1063/1.2785824
    • A. N. Morozovska, E. A. Eliseev, and S. V. Kalinin, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.2785824 102, 074105 (2007). (Pubitemid 47587856)
    • (2007) Journal of Applied Physics , vol.102 , Issue.7 , pp. 074105
    • Morozovska, A.N.1    Eliseev, E.A.2    Kalinin, S.V.3
  • 62
    • 84867804858 scopus 로고    scopus 로고
    • (Butterworth-Heinemann, Oxford, UK
    • L. Landau and E. Lifshitz (Butterworth-Heinemann, Oxford, UK, 1998).
    • (1998)
    • Landau, L.1    Lifshitz, E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.