The piezoresponse force microscopy of surface layers and thin films: Effective response and resolution function

Journal of Applied Physics

Volumn 102, Issue 7, 2007, Pages

  Morozovska, Anna N ^a   Eliseev, Eugene A ^b   Kalinin, Sergei V ^c  

^a INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

^b FRANTSEVICH INSTITUTE FOR PROBLEMS OF MATERIALS SCIENCE   (Ukraine)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; FERROELECTRIC DEVICES; MICROSCOPIC EXAMINATION; RIGIDITY; SIGNAL GENERATORS; SURFACE ANALYSIS; THICKNESS CONTROL;

OBJECT TRANSFER FUNCTION COMPONENTS; PIEZORESPONSE FORCE MICROSCOPY (PFM); RAYLEIGH TWO-POINT RESOLUTION;

THIN FILMS;

EID: 35348864362     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2785824     Document Type: Article

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