Electromechanical detection in scanning probe microscopy: Tip models and materials contrast

Journal of Applied Physics

Volumn 102, Issue 1, 2007, Pages

  Eliseev, Eugene A ^a   Kalinin, Sergei V ^b   Jesse, Stephen ^b   Bravina, Svetlana L ^c   Morozovska, Anna N ^d  

^a FRANTSEVICH INSTITUTE FOR PROBLEMS OF MATERIALS SCIENCE   (Ukraine)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c INSTITUTE OF HYDROBIOLOGY   (Ukraine)

^d INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMECHANICAL DEVICES; MATERIALS SCIENCE; MOLECULAR STRUCTURE; NANOTECHNOLOGY; PIEZOELECTRIC MATERIALS;

ELECTROMECHANICAL BEHAVIORS; ELECTROMECHANICAL DETECTION; PIEZORESPONSE FORCE MICROSCOPY (PFM);

SCANNING PROBE MICROSCOPY;

EID: 34547147924     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2749463     Document Type: Article

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