Contrast mechanisms for the detection of ferroelectric domains with scanning force microscopy

New Journal of Physics

Volumn 11, Issue , 2009, Pages

  Jungk, Tobias ^a   Hoffmann, Ákos ^a   Soergel, Elisabeth ^a  

^a UNIVERSITY OF BONN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BULK SINGLE CRYSTALS; CONTRAST MECHANISMS; CRYSTAL FACES; CRYSTALLOGRAPHIC AXES; DIFFERENT MECHANISMS; DOMAIN BOUNDARIES; DOMAIN STRUCTURES; DRIVING FORCES; FERROELECTRIC DOMAINS; IN-PLANE PIEZORESPONSE; LATERAL DISPLACEMENTS; LITHIUM NIOBATE; PIEZOELECTRIC RESPONSE; PIEZORESPONSE FORCE MICROSCOPIES; SAMPLE SURFACES; SCANNING FORCE MICROSCOPIES; TIP-SAMPLE INTERACTIONS;

CRYSTAL STRUCTURE; FERROELECTRICITY; NIOBIUM COMPOUNDS; SCANNING; SCANNING TUNNELING MICROSCOPY;

SINGLE CRYSTALS;

EID: 65549090438     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/11/3/033029     Document Type: Article

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