Modeling and measurement of surface displacements in BaTiO 3 bulk material in piezoresponse force microscopy

Journal of Applied Physics

Volumn 96, Issue 1, 2004, Pages 563-568

  Felten, F ^a   Schneider, G A ^a   Munoz Saldana J ^b   Kalinin, S V ^c  

^a HAMBURG UNIVERSITY OF TECHNOLOGY   (Germany)

^b Lab de Invest en Materiales   (Mexico)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE CONTRASTS; PIEZORESPONSE FORCE MICROSCOPY; SURFACE DISPLACEMENTS; TIP-SURFACE INTERACTIONS;

ANISOTROPY; ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; GREEN'S FUNCTION; IMAGE ANALYSIS; LIGHT POLARIZATION; PIEZOELECTRIC DEVICES; SAMPLING; SINGLE CRYSTALS; VECTORS;

BARIUM TITANATE;

EID: 3142669844     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1758316     Document Type: Article

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