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Volumn 97, Issue 10, 2010, Pages

Lateral signals in piezoresponse force microscopy at domain boundaries of ferroelectric crystals

Author keywords

[No Author keywords available]

Indexed keywords

DOMAIN BOUNDARY; EXPERIMENTAL DATA; FERROELECTRIC CRYSTAL; PIEZORESPONSE FORCE MICROSCOPY; THEORETICAL MODELING;

EID: 77956608930     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3486226     Document Type: Article
Times cited : (20)

References (19)
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    • (1992) Appl. Phys. Lett. , vol.61 , pp. 1137
    • Güthner, P.1    Dransfeld, K.2
  • 2
  • 5
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    • NJOPFM 1367-2630,. 10.1088/1367-2630/11/3/033029
    • T. Jungk, Á. Hoffmann, and E. Soergel, New J. Phys. NJOPFM 1367-2630 11, 033029 (2009). 10.1088/1367-2630/11/3/033029
    • (2009) New J. Phys. , vol.11 , pp. 033029
    • Jungk, T.1    Hoffmann, Á.2    Soergel, E.3
  • 7
  • 9
    • 33746590809 scopus 로고    scopus 로고
    • Detection mechanism for ferroelectric domain boundaries with lateral force microscopy
    • DOI 10.1063/1.2234303
    • T. Jungk, Á. Hoffmann, and E. Soergel, Appl. Phys. Lett. APPLAB 0003-6951 89, 042901 (2006). 10.1063/1.2234303 (Pubitemid 44147579)
    • (2006) Applied Physics Letters , vol.89 , Issue.4 , pp. 042901
    • Jungk, T.1    Hoffmann, A.2    Soergel, E.3
  • 11
    • 77956598310 scopus 로고    scopus 로고
    • private communication, the y -axis of Fig. 14 in Ref. should have been labeled in picometer. From this corrected graph one obtains α=0. 0062°(2 March 2006).
    • D. Scrymgeour, private communication, the y -axis of Fig. 14 in Ref. should have been labeled in picometer. From this corrected graph one obtains α=0.0062°(2 March 2006).
    • Scrymgeour, D.1
  • 12
    • 0024622335 scopus 로고
    • ELLEAK 0013-5194,. 10.1049/el:19890272
    • H. Okamura and J. Minowa, Electron. Lett. ELLEAK 0013-5194 25, 395 (1989). 10.1049/el:19890272
    • (1989) Electron. Lett. , vol.25 , pp. 395
    • Okamura, H.1    Minowa, J.2
  • 13
    • 0003739507 scopus 로고    scopus 로고
    • edited by R. J. Colton, J. E. Frommer, A. Engel, H. E. Gaub, R. Guckenberger, W. M. Heckl, B. Parkinson, J. Rabe, and A. Gewirth (Wiley, New York).
    • Procedures in Scanning Probe Microscopies, edited by, R. J. Colton, J. E. Frommer, A. Engel, H. E. Gaub, R. Guckenberger, W. M. Heckl, B. Parkinson, J. Rabe, and, A. Gewirth, (Wiley, New York, 1998).
    • (1998) Procedures in Scanning Probe Microscopies
  • 16
    • 77956607993 scopus 로고    scopus 로고
    • Subtracting the distorted baseline would increase the full amplitude of the LSbd at most by a factor of 2.
    • Subtracting the distorted baseline would increase the full amplitude of the LSbd at most by a factor of 2.
  • 17
    • 77956576266 scopus 로고    scopus 로고
    • Improvements of the model might include the d22 and also the effect of sideways clamping that suppresses shear deformations.
    • Improvements of the model might include the d22 and also the effect of sideways clamping that suppresses shear deformations.
  • 18
    • 38449111904 scopus 로고    scopus 로고
    • Impact of the tip radius on the lateral resolution in piezoresponse force microscopy
    • DOI 10.1088/1367-2630/10/1/013019
    • T. Jungk, Á. Hoffmann, and E. Soergel, New J. Phys. NJOPFM 1367-2630 10, 013019 (2008). 10.1088/1367-2630/10/1/013019 (Pubitemid 351143269)
    • (2008) New Journal of Physics , vol.10 , pp. 013019
    • Jungk, T.1    Hoffmann, A.2    Soergel, E.3
  • 19
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    • A detailed description of this issue can be found in Ref. where Fig. 5 is of particular interest.
    • A detailed description of this issue can be found in Ref. where Fig. 5 is of particular interest.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.