-
1
-
-
56549107714
-
-
Appenzeller, J.; Knoch, J.; Bjork, M. I.; Riel, H.; Schmid, H.; Riess, W. IEEE Trans. Electron Devices 2008, 55 (11) 2827-2845
-
(2008)
IEEE Trans. Electron Devices
, vol.55
, Issue.11
, pp. 2827-2845
-
-
Appenzeller, J.1
Knoch, J.2
Bjork, M.I.3
Riel, H.4
Schmid, H.5
Riess, W.6
-
6
-
-
77957571035
-
-
In; South Bend, IN; Device Research Conference (DRC), June 21-23
-
Smith, J. T.; Zhao, Y.; Yang, C.; Appenzeller, J. In Effects of nanoscale contacts to silicon nanowires on contact resistance: Characterization and Modeling; South Bend, IN; Device Research Conference (DRC), June 21-23, 2010; pp 139-140.
-
(2010)
Effects of Nanoscale Contacts to Silicon Nanowires on Contact Resistance: Characterization and Modeling
, pp. 139-140
-
-
Smith, J.T.1
Zhao, Y.2
Yang, C.3
Appenzeller, J.4
-
7
-
-
61649109093
-
-
Ford, A. C.; Ho, J. C.; Chueh, Y.-L.; Tseng, Y.-C.; Fan, Z.; Guo, J.; Bokor, J.; Javey, A. Nano Lett. 2009, 9 (1) 360-365
-
(2009)
Nano Lett.
, vol.9
, Issue.1
, pp. 360-365
-
-
Ford, A.C.1
Ho, J.C.2
Chueh, Y.-L.3
Tseng, Y.-C.4
Fan, Z.5
Guo, J.6
Bokor, J.7
Javey, A.8
-
8
-
-
0037120521
-
-
Appenzeller, J.; Knoch, J.; Derycke, V.; Martel, R.; Wind, S.; Avouris, P. Phys. Rev. Lett. 2002, 89 (12) 126801
-
(2002)
Phys. Rev. Lett.
, vol.89
, Issue.12
, pp. 126801
-
-
Appenzeller, J.1
Knoch, J.2
Derycke, V.3
Martel, R.4
Wind, S.5
Avouris, P.6
-
9
-
-
48249130047
-
-
Caroff, P.; Wagner, J. B.; Dick, K. A.; Nilsson, H. A.; Jeppsson, M.; Deppert, K.; Samuelson, L.; Wallenberg, L. R.; Wernersson, L.-E. Small 2008, 4 (7) 878-882
-
(2008)
Small
, vol.4
, Issue.7
, pp. 878-882
-
-
Caroff, P.1
Wagner, J.B.2
Dick, K.A.3
Nilsson, H.A.4
Jeppsson, M.5
Deppert, K.6
Samuelson, L.7
Wallenberg, L.R.8
Wernersson, L.-E.9
-
10
-
-
70450209495
-
-
Ercolani, D.; Rossi, F.; Li, A.; Roddaro, S.; Grillo, V.; Salviati, G.; Beltram, F.; Sorba, L. Nanotechnology 2009, 20 (50) 505605
-
(2009)
Nanotechnology
, vol.20
, Issue.50
, pp. 505605
-
-
Ercolani, D.1
Rossi, F.2
Li, A.3
Roddaro, S.4
Grillo, V.5
Salviati, G.6
Beltram, F.7
Sorba, L.8
-
11
-
-
79957938587
-
-
Vogel, A. T.; de Boor, J.; Wittemann, J. V.; Mensah, S. L.; Werner, P.; Schmidt, V. Cryst. Growth Des. 2011, 11 (5) 1896-1900
-
(2011)
Cryst. Growth Des.
, vol.11
, Issue.5
, pp. 1896-1900
-
-
Vogel, A.T.1
De Boor, J.2
Wittemann, J.V.3
Mensah, S.L.4
Werner, P.5
Schmidt, V.6
-
12
-
-
27644552675
-
-
Zhang, X. R.; Hao, Y. F.; Meng, G. W.; Zhang, L. D. J. Electrochem. Soc. 2005, 152 (10) C664-C668
-
(2005)
J. Electrochem. Soc.
, vol.152
, Issue.10
-
-
Zhang, X.R.1
Hao, Y.F.2
Meng, G.W.3
Zhang, L.D.4
-
13
-
-
49749149490
-
-
Khan, M. I.; Wang, X.; Bozhilov, K. N.; Ozkan, C. S. J. Nanomater. 2008, 698759
-
(2008)
J. Nanomater.
, pp. 698759
-
-
Khan, M.I.1
Wang, X.2
Bozhilov, K.N.3
Ozkan, C.S.4
-
14
-
-
34248596817
-
-
Park, H. D.; Prokes, S. M.; Twigg, M. E.; Ding, Y.; Wang, Z. L. J. Cryst. Growth 2007, 304 (2) 399-401
-
(2007)
J. Cryst. Growth
, vol.304
, Issue.2
, pp. 399-401
-
-
Park, H.D.1
Prokes, S.M.2
Twigg, M.E.3
Ding, Y.4
Wang, Z.L.5
-
15
-
-
77953170793
-
-
Yang, X.; Wang, G.; Slattery, P.; Zhang, J. Z.; Li, Y. Cryst. Growth Des. 2010, 10 (6) 2479-2482
-
(2010)
Cryst. Growth Des.
, vol.10
, Issue.6
, pp. 2479-2482
-
-
Yang, X.1
Wang, G.2
Slattery, P.3
Zhang, J.Z.4
Li, Y.5
-
16
-
-
34250377868
-
-
Vaddiraju, S.; Sunkara, M. K.; Chin, A. H.; Ning, C. Z.; Dholakia, G. R.; Meyyappan, M. J. Phys. Chem. C 2007, 111 (20) 7339-7347
-
(2007)
J. Phys. Chem. C
, vol.111
, Issue.20
, pp. 7339-7347
-
-
Vaddiraju, S.1
Sunkara, M.K.2
Chin, A.H.3
Ning, C.Z.4
Dholakia, G.R.5
Meyyappan, M.6
-
17
-
-
70449839786
-
-
Caroff, P.; Messing, M. E.; Mattias Borg, B.; Dick, K. A.; Deppert, K.; Wernersson, L.-E. Nanotechnology 2009, 20 (49) 495606
-
(2009)
Nanotechnology
, vol.20
, Issue.49
, pp. 495606
-
-
Caroff, P.1
Messing, M.E.2
Mattias Borg, B.3
Dick, K.A.4
Deppert, K.5
Wernersson, L.-E.6
-
18
-
-
84863643257
-
-
Zi, Y.; Zhao, Y.; Candebat, D.; Appenzeller, J.; Yang, C. ChemPhysChem 2012, 13 (10) 2585-2588
-
(2012)
ChemPhysChem
, vol.13
, Issue.10
, pp. 2585-2588
-
-
Zi, Y.1
Zhao, Y.2
Candebat, D.3
Appenzeller, J.4
Yang, C.5
-
19
-
-
77951614503
-
-
Nilsson, H. A.; Caroff, P.; Thelander, C.; Lind, E.; Karlstrom, O.; Wernersson, L.-E. Appl. Phys. Lett. 2010, 96 (15) 153505
-
(2010)
Appl. Phys. Lett.
, vol.96
, Issue.15
, pp. 153505
-
-
Nilsson, H.A.1
Caroff, P.2
Thelander, C.3
Lind, E.4
Karlstrom, O.5
Wernersson, L.-E.6
-
20
-
-
79960596428
-
-
Das, S. R.; Delker, C. J.; Zakharov, D.; Chen, Y. P.; Sands, T. D.; Janes, D. B. Appl. Phys. Lett. 2011, 98 (24) 243504
-
(2011)
Appl. Phys. Lett.
, vol.98
, Issue.24
, pp. 243504
-
-
Das, S.R.1
Delker, C.J.2
Zakharov, D.3
Chen, Y.P.4
Sands, T.D.5
Janes, D.B.6
-
21
-
-
79751486198
-
-
Wang, Y.; Chi, J.; Banerjee, K.; Gruetzmacher, D.; Schaepers, T.; Lu, J. G. J. Mater. Chem. 2011, 21 (8) 2459-2462
-
(2011)
J. Mater. Chem.
, vol.21
, Issue.8
, pp. 2459-2462
-
-
Wang, Y.1
Chi, J.2
Banerjee, K.3
Gruetzmacher, D.4
Schaepers, T.5
Lu, J.G.6
-
22
-
-
77950296462
-
-
Paul, R. K.; Penchev, M.; Zhong, J.; Ozkan, M.; Ghazinejad, M.; Jing, X.; Yengel, E.; Ozkan, C. S. Mater. Chem. Phys. 2010, 121 (3) 397-401
-
(2010)
Mater. Chem. Phys.
, vol.121
, Issue.3
, pp. 397-401
-
-
Paul, R.K.1
Penchev, M.2
Zhong, J.3
Ozkan, M.4
Ghazinejad, M.5
Jing, X.6
Yengel, E.7
Ozkan, C.S.8
-
23
-
-
76549098788
-
-
In; University Park, PA; Device Research Conference (DRC), June 22-24
-
Candebat, D.; Zhao, Y.; Sandow, C.; Koshel, B.; Yang, C.; Appenzeller, J. In InSb nanowire field-effect transistors-Electrical characterization and material analysis; University Park, PA; Device Research Conference (DRC), June 22-24, 2009; pp 13-14.
-
(2009)
InSb Nanowire Field-effect Transistors - Electrical Characterization and Material Analysis
, pp. 13-14
-
-
Candebat, D.1
Zhao, Y.2
Sandow, C.3
Koshel, B.4
Yang, C.5
Appenzeller, J.6
-
24
-
-
36248972352
-
-
Jiang, X. C.; Xiong, Q. H.; Nam, S.; Qian, F.; Li, Y.; Lieber, C. M. Nano Lett. 2007, 7 (10) 3214-3218
-
(2007)
Nano Lett.
, vol.7
, Issue.10
, pp. 3214-3218
-
-
Jiang, X.C.1
Xiong, Q.H.2
Nam, S.3
Qian, F.4
Li, Y.5
Lieber, C.M.6
-
25
-
-
40749151146
-
-
Thelander, C.; Froberg, L. E.; Rehnstedt, C.; Samuelson, L.; Wemersson, L.-E. IEEE Electron Device Lett. 2008, 29 (3) 206-208
-
(2008)
IEEE Electron Device Lett.
, vol.29
, Issue.3
, pp. 206-208
-
-
Thelander, C.1
Froberg, L.E.2
Rehnstedt, C.3
Samuelson, L.4
Wemersson, L.-E.5
-
26
-
-
33749684169
-
-
Lind, E.; Persson, A. I.; Samuelson, L.; Wernersson, L.-E. Nano Lett. 2006, 6 (9) 1842-1846
-
(2006)
Nano Lett.
, vol.6
, Issue.9
, pp. 1842-1846
-
-
Lind, E.1
Persson, A.I.2
Samuelson, L.3
Wernersson, L.-E.4
-
27
-
-
0003570366
-
-
Addison-Wesley Publishing Company: Upper Saddle River, NJ.
-
Sakurai, J. J.; Tuan, S. F. Modern Quantum Mechanics; Addison-Wesley Publishing Company: Upper Saddle River, NJ, 1994.
-
(1994)
Modern Quantum Mechanics
-
-
Sakurai, J.J.1
Tuan, S.F.2
-
28
-
-
1442307031
-
-
Appenzeller, J.; Radosavljevic, M.; Knoch, J.; Avouris, P. Phys. Rev. Lett. 2004, 92 (4) 048301
-
(2004)
Phys. Rev. Lett.
, vol.92
, Issue.4
, pp. 048301
-
-
Appenzeller, J.1
Radosavljevic, M.2
Knoch, J.3
Avouris, P.4
-
30
-
-
4143096759
-
-
Javey, A.; Guo, J.; Farmer, D. B.; Wang, Q.; Yenilmez, E.; Gordon, R. G.; Lundstrom, M.; Dai, H. J. Nano Lett. 2004, 4 (7) 1319-1322
-
(2004)
Nano Lett.
, vol.4
, Issue.7
, pp. 1319-1322
-
-
Javey, A.1
Guo, J.2
Farmer, D.B.3
Wang, Q.4
Yenilmez, E.5
Gordon, R.G.6
Lundstrom, M.7
Dai, H.J.8
-
31
-
-
33745327664
-
-
Xiang, J.; Lu, W.; Hu, Y. J.; Wu, Y.; Yan, H.; Lieber, C. M. Nature 2006, 441 (7092) 489-493
-
(2006)
Nature
, vol.441
, Issue.7092
, pp. 489-493
-
-
Xiang, J.1
Lu, W.2
Hu, Y.J.3
Wu, Y.4
Yan, H.5
Lieber, C.M.6
-
33
-
-
70449652166
-
-
In; June 2-5, 2009, Traverse City, MI, IEEE Nanotechnology Materials and Devices Conference (NMDC): New York
-
Chen, H.; Sun, X.; Lai, K. W. C.; Meyyappan, M.; Xi, N. In Infrared Detection Using an InSb Nanowire; June 2-5, 2009, Traverse City, MI, IEEE Nanotechnology Materials and Devices Conference (NMDC): New York, 2009; pp 212-216.
-
(2009)
Infrared Detection Using An InSb Nanowire
, pp. 212-216
-
-
Chen, H.1
Sun, X.2
Lai, K.W.C.3
Meyyappan, M.4
Xi, N.5
-
34
-
-
44849131591
-
-
Ju, S.; Ishikawa, F.; Chen, P.; Chang, H.-K.; Zhou, C.; Ha, Y.-g.; Liu, J.; Facchetti, A.; Marks, T. J.; Janes, D. B. Appl. Phys. Lett. 2008, 92 (22) 222105
-
(2008)
Appl. Phys. Lett.
, vol.92
, Issue.22
, pp. 222105
-
-
Ju, S.1
Ishikawa, F.2
Chen, P.3
Chang, H.-K.4
Zhou, C.5
Ha, Y.-G.6
Liu, J.7
Facchetti, A.8
Marks, T.J.9
Janes, D.B.10
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